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Test method for electronic device program

A technology of an electronic device and a test method, which is applied in the field of testing that can dynamically and automatically modify the program code of an electronic device, and can solve problems such as time-consuming and labor-intensive

Inactive Publication Date: 2007-12-26
BENQ CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0009] The method of using the pre-processor mark is still feasible when there are few program codes about the hardware. However, the software functions of electronic devices are more and more, and many program codes for hardware access operations are also more. Therefore, it would be time-consuming and labor-intensive to manually add each hardware-related program code to the above-mentioned pre-processing control.

Method used

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  • Test method for electronic device program
  • Test method for electronic device program
  • Test method for electronic device program

Examples

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no. 1 example

[0018] FIG. 1A and FIG. 1B are block diagrams of making an emulator version and a hardware version of a mobile phone program, respectively. Please refer to FIG. 1A, which shows a block diagram of making an emulator version of a mobile phone program. The source code (source code) A.C of the mobile phone program A and the source code B.C of the simulation sub-function may be written in different languages ​​such as C language, C++ language or JAVA programming language, and are generated after compiling and linking by the compiler / linker 100 The emulator executes the file (A+B).exe, and this file can be executed in the computer to perform a simulation test on the mobile phone program A. The simulated side function source code B.C enables the mobile phone program A to execute the required side function in the computer to serve as the interface between the mobile phone program A and the computer's operating system. The source code of the mobile phone program A is related to at leas...

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Abstract

Disclosed is a testing method for electronic devices which comprises: loading electronic device program to program storage in computer; then performing the electronic device program, Operating System performs an error processing routine if storage accessing error occurs; the error processing gets address of a command code which causes the storage error first, then modifies command code in the program storage according to the program code address to prevent stage accessing errors.

Description

technical field [0001] The invention relates to a testing method of an electronic device program, in particular to a testing method capable of dynamically and automatically modifying the electronic device program code. Background technique [0002] Generally, the current development of electronic devices can be divided into two parts, one part is hardware, and the other part belongs to the software development of electronic devices. In the current software development process, the program is usually written in the computer, and after the writing is completed, the emulator (Simulator) in the computer simulates the hardware work for testing and debugging (Debug) operations. After the hardware development is completed, the software can be directly ported to the hardware to work together with the hardware. [0003] There are many access operations to the hardware in the program code of the software. Taking a mobile phone as an example, these access operations are to control pe...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06F11/36
Inventor 郑耀杰
Owner BENQ CORP
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