Fast frequency point conversion method and apparatus

Abstract

The invention provides a fast frequency point conversion method, which comprises the steps: an establishing frequency point of a testing instrument is a cell of a set frequency point, and a terminal carries out conformance testing of radio frequency under the set frequency point; and after the testing under the current set frequency point is finished and when frequency point conversion is determined, a deleting frequency point of the testing instrument is the cell of the current set frequency point, the establishing frequency point is the cell of a next set frequency point, and the terminal carries out the conformance testing of the radio frequency under the next set frequency point. The invention provides a device for realizing the fast frequency point conversion simultaneously, and the device and the method realize fast conversion of the frequency points in the conformance testing process of the radio frequency and reduce the consumed time of the terminal for carrying out the conformance testing of the radio frequency.

Description

technical field [0001] The invention relates to a terminal radio frequency consistency test technology, in particular to a method and device for fast frequency point conversion. Background technique [0002] The time-division synchronous code division multiple access (TD-SCDMA) communication standard will be commercialized on a large scale soon, and the quality and performance of terminal products will not only affect the market division and profit distribution of each terminal manufacturer, but can even affect the development of the entire TD-SCDMA industry. Therefore, each terminal needs to undergo rigorous testing from R&D to production. These tests include radio frequency conformance testing, protocol conformance testing, machine stability testing, environmental adaptability testing, electromagnetic compatibility testing, etc. [0003] In the terminal radio frequency conformance test technology, the test instrument needs to establish a single frequency point or multi-fre...

AI Technical Summary

Problems solved by technology

However, the cost of a test instrument that supports the establishment of a multi-frequency cell or multiple single-frequency cells at the same time is much higher than that of a test instrument that only supports the establishment of a single-frequency cell

The increase of test cost will undoubtedly greatly reduce the product competitiveness of the terminal for the production line

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