Method and device for testing performance of Ethernet port

A test method and test device technology, applied in the direction of digital transmission system, data exchange network, electrical components, etc., can solve the problems of complicated wiring and instrument configuration, etc.

Active Publication Date: 2010-02-17
ZTE CORP
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] The technical problem to be solved by the present invention is to provide a performance test method and device under the limit flow rate of the Ethernet po

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  • Method and device for testing performance of Ethernet port
  • Method and device for testing performance of Ethernet port
  • Method and device for testing performance of Ethernet port

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Embodiment Construction

[0025] The technical solutions of the embodiments of the present invention will be described in further detail below with reference to the drawings and embodiments.

[0026] In order to carry out automatic packet sending test for full traffic on an Ethernet port without using a data tester, the present invention provides a performance testing method and device for an Ethernet port.

[0027] If you do not rely on contracting tools such as data testers of the prior art, the most convenient method is to use a CPU (central processor unit, central processing unit) to construct a data message and send it to the port. However, if you only rely on the CPU to send packets, the traffic of the Ethernet port cannot reach the limit (the limit flow of the Fast Ethernet port is 100 Mbps), because the CPU's packet sending frequency is very limited.

[0028] In order to solve the above problems, the present invention provides a simple device, which allows the CPU to send only a small amount of...

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Abstract

The invention relates to method and device for testing the performance of an Ethernet port. The method comprises the following steps: a centre processor of data equipment to be tested automatically creates a test flow region; the centre processor of the data equipment to be tested sends at least one broadcast data packet to an Ethernet port to be tested of the data equipment to be tested; the broadcast data packet is forwarded in the test flow region under the control of a single port loop device so as to carry out performance test. The device comprises the data equipment to be tested and thesingle port loop device, wherein the data equipment to be tested is used for automatically creating the test flow region and sending the broadcast data packet to the Ethernet port to be tested of thedata equipment to be tested; and the single port loop device is connected with the data equipment to be tested and used for forwarding the broadcast data packet in the test flow region. Therefore, theinvention proposes that a CPU issues a few packets to enable the test of the Ethernet port to meet the full flow requirement in the way of broadcast storm of a signal port and the rapid starting andstopping control of storm is realized without using a data test instrument.

Description

technical field [0001] The invention relates to the field of switch data communication, in particular to a performance test method and device applied to an Ethernet port of a packet transport network device (Packet Transport Network, PTN for short). Background technique [0002] After the data exchange equipment is processed on the production line, it needs to perform a full flow limit test in a high temperature room to verify the high temperature aging performance of the equipment, especially the high temperature full flow load performance of the Ethernet port. Low-end data products generally adopt the method of static high-temperature aging test, that is, they are placed in a high-temperature box for 24 hours without any operation or load, and the test efficiency and effectiveness are not high. [0003] The dynamic high-temperature aging method, while baking the equipment at high temperature, allows the equipment to operate according to a certain strategy, and the key chip...

Claims

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Application Information

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IPC IPC(8): H04L12/24H04L12/56
Inventor 吴建华
Owner ZTE CORP
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