Method and device for testing performance of Ethernet port

Abstract

The invention relates to method and device for testing the performance of an Ethernet port. The method comprises the following steps: a centre processor of data equipment to be tested automatically creates a test flow region; the centre processor of the data equipment to be tested sends at least one broadcast data packet to an Ethernet port to be tested of the data equipment to be tested; the broadcast data packet is forwarded in the test flow region under the control of a single port loop device so as to carry out performance test. The device comprises the data equipment to be tested and thesingle port loop device, wherein the data equipment to be tested is used for automatically creating the test flow region and sending the broadcast data packet to the Ethernet port to be tested of thedata equipment to be tested; and the single port loop device is connected with the data equipment to be tested and used for forwarding the broadcast data packet in the test flow region. Therefore, the invention proposes that a CPU issues a few packets to enable the test of the Ethernet port to meet the full flow requirement in the way of broadcast storm of a signal port and the rapid starting andstopping control of storm is realized without using a data test instrument.

Description

technical field [0001] The invention relates to the field of data communication of switches, in particular to a performance testing method and device applied to an Ethernet port of a Packet Transport Network (PTN) device. Background technique [0002] After the data exchange equipment is processed on the production line, it is necessary to perform a full flow limit test in a high temperature room to verify the high temperature aging performance of the equipment, especially the high temperature full flow load performance of the Ethernet port. Low-end data products generally adopt the static high temperature aging test method, that is, placed in a high temperature box for 24 hours without any operation and load, and the test efficiency and effectiveness are not high. [0003] In the dynamic high-temperature aging method, while the equipment is baked at a high temperature, the equipment runs according to a certain strategy, and the key chips are all in working state and have a ...

AI Technical Summary

Problems solved by technology

[0005] The technical problem to be solved by the present invention is to provide a performance test method and device under the limit flow rate of the Ethernet port, which solves the need for a large number of data testers in the prior art, manual intervention, complicated wiring and instrument configuration, etc. question

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