Bus-based test module

Abstract

The invention provides a digital test module based on a PXI (PCI (peripheral component interconnect) eXtension for instrumentation) bus and applicable to the field of automatic test systems. The digital test module based on the PXI bus comprises a PXI bus interface circuit, a FPGA (field programmable gate array) built-in function circuit, a front drive circuit, a synchronous trigger circuit, a changeable clock control circuit and the like. A PXI module has the advantages of being high in integration level, good in board stability, high in systematical flexibility and low in cost. The PXI bus-based digital test module is an important data testing instrument; can exert digital excitation on a target system and obtain response data generated by the system according to actual requirements during the equipment debugging and the fault diagnosis of digital systems; and provides a valuable testing basis for the performance test, the field debugging and the fault diagnosis of the digital systems, thereby being wide in application range and important in application value. The development of the PXI bus-based digital test module is significant to improving the research level of digital test instruments.

Description

technical field [0001] The invention provides a digital test module based on PXI bus. Background technique [0002] With the increasing complexity of digital systems, the testing of digital systems and digital devices becomes more and more complex. Traditional methods usually use a digital signal generator to provide excitation and use a logic analyzer to collect response data. It is difficult to establish a complex logical reasoning relationship between excitation and response. Therefore, modern automatic test systems need high-speed digital test instruments with more powerful functions. PXI bus is a new generation of automatic test bus. It has a series of advantages such as small size, fast measurement speed, and convenient use. It has been used in the test of a new generation of weapon systems. [0003] The digital test module based on PXI bus is an important data domain test instrument. It can apply digital excitation to the target system according to actual needs in th...

AI Technical Summary

Problems solved by technology

The three SRAMs inside the module perform their own duties, respectively responsible for outputting excitation, recording response, and defining channel direction within one clock cycle, which solves the technical problem that any channel can output excitation or capture response as needed at any time during use

Images