time-of-flight mass analyzer
A mass analysis device and time-of-flight technology, applied in the field of ion incident optical systems, can solve the problems of reliability, troublesome operation, labor-intensive and other problems, and achieve the effect of easy assembly, easy manufacture, and reduced angular spread
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[0054] The orthogonal acceleration method TOFMS of an embodiment of the present invention will be described with reference to the drawings. figure 2 It is the overall structure diagram of the orthogonal acceleration mode TOFMS of this embodiment, figure 1 It is a schematic structure diagram (a) and optical equivalent structure diagrams (b) and (c) of the ion incident optical system in the orthogonal acceleration method TOFMS.
[0055] The orthogonal acceleration method TOFMS of this embodiment includes: an ion source 1, which ionizes a target sample; a TOF analyzer 5, which includes a reflector 51; and an orthogonal acceleration section 4, which accelerates ions and sends them into the TOF Analyzer 5; Electrostatic lens 3, which sends ions emitted from the ion source 1 into the orthogonal acceleration part 4; Detector 6, which detects ions flying in the flight space of the TOF analyzer 5; Data processing part 16 , Which processes the data obtained by the detector 6 to produce, f...
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