A Segmented Integration Method for Silicon Array Detectors

Abstract

The invention provides a method for subsection integral of a silicon array detector. A drive pulse timing sequence is changed through software design of a programmable logic array, and therefore the integral time of picture elements of all sections are adjusted. According to the method for the subsection integral of the silicon array detector, the problem that certain picture elements output signals are small due to the fact that incident light of different intensities irradiates on different positions of the silicon array detector is solved, and the signal to noise ratio of the output signals is improved. The subsection integral method is based on software design, is easy to achieve, low in cost and high in reliability, and avoids complex hardware design.

Description

technical field [0001] The invention relates to the technical field of photoelectric detection, and provides a method for segmental integration of a silicon array detector. Background technique [0002] The silicon array detector is a self-scanning photodiode array device designed for multi-channel spectral imaging detection. When the incident light from the imaging target and through the optical system hits the silicon array detector, under the control of the clock pulse and the start pulse, the charge signal generated by the detector is read out from the signal output line. The output charge of the silicon array detector is equal to the product of the illuminance of the incident light, the integration time and the spectral sensitivity. The time interval between two adjacent readout signals corresponding to the same pixel is called the integration time, and this period of time is the accumulation time of photoelectrons generated by the pixel under the irradiation of incide...

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Conversely, the output signal may saturate

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