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High-precision broadband measurement method for dielectric property of low-loss material

A technology for dielectric properties and broadband testing, applied in the field of testing, to achieve high measurement accuracy

Active Publication Date: 2014-08-13
CHINA ELECTRONIS TECH INSTR CO LTD
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Problems solved by technology

Since only TE 011 mode, so similar to other resonance methods, only point frequency measurements can be achieved, which is the main shortcoming of this method

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  • High-precision broadband measurement method for dielectric property of low-loss material
  • High-precision broadband measurement method for dielectric property of low-loss material

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Embodiment Construction

[0020] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0021] At present, for testing the dielectric properties of low-loss materials, the accuracy of broadband testing methods is poor; although resonant cavity methods have high testing accuracy, they can generally only measure point frequencies. For example, the existing split cylindrical resonant cavity technology adopts Single mode is TE 011 Mode tests the dielectric properties of low-loss materials, so only the dielectric properties of materials at a certain f...

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Abstract

The invention provides a high-precision broadband measurement method for the dielectric property of a low-loss material. The high-precision broadband measurement method is applicable to a split type cylindrical resonant cavity. Two flange plates of the split type cylindrical resonant cavity form radial waveguides, the measured material is clamped between two half cavities to be measured in the modes of TE011, TE111, TE211, TE311, TE411, TE511, TE611, TE711, TE811 and TE911; all the measurement modes are identified through the constraint relation between the resonant frequencies of the measurement modes and dielectric constants on the basis of a recursion method, and the dielectric constants of the measured material at the resonant frequencies of the measurement modes are calculated. Meanwhile, material loss at the resonant frequencies of the measurement modes is calculated through the relation between quality factors of the measurement modes and material loss. In this way, the dielectric property of the low-loss material at multiple frequency points is obtained through measurement.

Description

technical field [0001] The invention relates to the technical field of testing, in particular to a high-precision broadband testing method for the dielectric properties of low-loss materials. Background technique [0002] The design and manufacture of microwave circuits and microwave components need to know the dielectric properties of the materials used in advance, so the measurement technology of electromagnetic properties of materials plays an important role in the field of microwave engineering. Low-loss dielectric materials are widely used in the field of microwave engineering. For example, various substrates used in microstrip circuits and dielectric plates used in radome are all low-loss materials. With the continuous increase of broadband applications of such materials, their broadband dielectric properties have increasingly become a realistic demand in the field of microwave engineering. [0003] The testing methods for the dielectric properties of low-loss materia...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R27/26
Inventor 年夫顺姜万顺邱兆杰
Owner CHINA ELECTRONIS TECH INSTR CO LTD
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