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Keyboard life test device

A technology of life testing and keyboard, which is applied in the direction of circuit breaker testing, etc., can solve the problems of wasting energy, wasting electricity, wasting time, etc., and achieve the effect of saving time and electricity, saving energy, and avoiding disassembly and installation of the machine

Inactive Publication Date: 2017-08-15
SHENXUN COMP KUNSHAN
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0009] Therefore, the object of the present invention is to provide a keyboard life testing device to solve the problems of wasting time, wasting power and wasting energy in the above-mentioned keyboard life testing method

Method used

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Embodiment Construction

[0023] The keys of a general keyboard are all controlled by a matrix diagram to realize corresponding functions, that is, the coordinates of the buttons are determined by the row lines and column lines in the matrix diagram, and when the buttons on the coordinate positions are pressed down, the internal The circuit will be conducted due to the contact, thereby producing a specific character model represented by the coordinates. see figure 1 and figure 2 As shown, perform life test on three keys as required.

[0024] For this purpose, please refer to the image 3 It is shown that the keyboard life test device provided by the present invention is applied to the notebook computer keyboard test, the keyboard 100 has keys 200 marked with different numbers, and the keys 200 include inlets and outlets distributed on the edge of the grid matrix, The inlet has first to sixteenth signal pins (1~~16), the outlet has seventeenth to twenty-fourth signal pins (17~~24), and the testing d...

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Abstract

A keyboard life test device, which is used in notebook computer keyboard testing, the keyboard has keys marked with different numbers, the keys have the first to twenty-fourth signal pins, the test device includes: a keyboard row A line having first to twenty-fourth terminals corresponding to the first to twenty-fourth signal pins; a keyboard connector having first to twenty-fourth terminals corresponding to the first to twenty-fourth terminals Twenty-four pins; test circuit, which includes a display unit, a power supply unit and a wire, the display unit and the power supply unit are electrically connected in series in the wire, and one end of the wire is connected to the first to tenth any one of the six pins, and the other end is connected to any one of the seventeenth to twenty-fourth pins. The present invention can monitor the state of the key to be tested at any time, without having to take off the keyboard every million times of testing, thereby saving energy and avoiding frequent disassembly and installation of the machine platform and stopping of the life testing machine.

Description

[0001] 【Technical field】 [0002] The invention relates to a test device, in particular to a keyboard life test device. [0003] 【Background technique】 [0004] With the improvement of living standards, people's requirements for the quality of electronic products are also getting higher and higher. In order to ensure the quality of electronic products, durability (reliability) tests are carried out on keys before electronic products are shipped, so as to ensure that the keys of electronic products can maintain good electrical performance during use. [0005] The traditional durability test for keys is to directly set the number of on / off keys in the system. For example, for the life test of ordinary keys and function keys in a laptop keyboard, the ordinary keys are set to be pressed 20 million times, and the function keys are set to be pressed 10 million times. Regarding the test of the life of the laptop keyboard, generally after every 2 million or 1 million presses on the l...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/327
Inventor 张荣斌
Owner SHENXUN COMP KUNSHAN
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