Device and method for measuring linear absorption and nonlinear absorption of material

A technology of nonlinear absorption and linear absorption, which is applied in the field of measuring devices for linear absorption and nonlinear absorption of materials, and can solve the problems of time-consuming and labor-intensive measurement

Active Publication Date: 2017-09-22
SHANGHAI INST OF OPTICS & FINE MECHANICS CHINESE ACAD OF SCI
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  • Summary
  • Abstract
  • Description
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  • Application Information

AI Technical Summary

Problems solved by technology

Although the above methods can achieve effective measurement of material absorption, they are all separate measurements of linear absorption and nonlinear absorption, and the measurement methods with high sensitivity require careful adjustment of the device, which is very time-consuming and labor-intensive to measure.
For the simultaneous measurement of linear absorption and nonlinear absorption in the same device, there are few related measurement studies

Method used

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  • Device and method for measuring linear absorption and nonlinear absorption of material
  • Device and method for measuring linear absorption and nonlinear absorption of material

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Embodiment Construction

[0029] The specific implementation manners of the present invention will be further described in detail below in conjunction with the accompanying drawings.

[0030] Such as figure 1 as shown, figure 1 It is a structural schematic diagram of Embodiment 1 of a measurement device for linear absorption and nonlinear absorption of materials including a four-quadrant detector according to the present invention. As can be seen from the figure, the present invention contains a measuring device for linear absorption and nonlinear absorption of a material with a four-quadrant detector, and the device includes:

[0031] The pumping optical path includes a pumping laser 1, and along the output light direction of the pumping laser 1 are a first attenuator 2, a beam splitter 3, a first reflecting mirror 5, a chopper 6, a second reflecting mirror 7, a first A long focus lens 8, a three-dimensional mobile platform 10 and an absorption pool 11, the three-dimensional mobile platform 10 is pl...

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Abstract

A device and method for measuring linear absorption and nonlinear absorption of a material are provided; according to the method, a sample is irradiated with a short-pulse high-repeating-frequency laser through the high-sensitivity photothermic technique insensitive to scattered light, a phase-locked amplifier is used to measure linear absorption of the sample under multi-pulse accumulative action, a Boxcar integrator is used to measure nonlinear absorption of the sample under single pulse, and linear absorption and nonlinear absorption are measured at the same time, and the novel method and means are provided for studying absorption features of the material. The device and method have the advantages of insensitivity to scattered light and high efficiency.

Description

technical field [0001] The invention relates to the measurement of material absorption, in particular to a measurement device and method for material linear absorption and nonlinear absorption. technical background [0002] Absorption, as one of the important performance indicators of materials, has been widely concerned by people. Measuring the absorption of a material can help to gain a better understanding of the material. Under high-energy laser irradiation, absorption is an important factor affecting material properties, and it is an important cause of soft / hard failure of materials, which limits the application of materials under high-energy and high-power laser irradiation. Therefore, it is necessary to measure the absorption of the material and study its absorption characteristics and absorption mechanism. [0003] For the measurement of material absorption, for linear absorption, spectrophotometer is mainly used at present. In addition, there are a series of photo...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/17G01N21/39G01N21/01
Inventor 赵元安彭小聪邵建达吴周令王岳亮曹珍李大伟胡国行
Owner SHANGHAI INST OF OPTICS & FINE MECHANICS CHINESE ACAD OF SCI
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