Module lens test method and system

A test method and test system technology, applied in the image field, can solve the problems of unsatisfactory test accuracy and tediousness

Inactive Publication Date: 2017-11-24
HUA WEI SEMICONDUCTOR (SHANGAHAI) CO LTD
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Problems solved by technology

[0004] Since the Spatial frequency response (SFR) measurement in the past is a simplified version of MFT, the resolution frequency is a fixed value every time a resolution map is captured. Therefore, for high-frequency resolution tests, it is necessary to frequently change the frequency and re-acquire different resolution maps, which is very cumbersome.
Therefore, for the sake of convenience, the traditional high-frequency resolution test of the chip module lens is to use the ISO12233chart (resolution test standard) for manual interpretation, resulting in the test accuracy not meeting the requirements

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Embodiment Construction

[0031] The module lens testing method and system proposed by the present invention will be further described in detail below in conjunction with the accompanying drawings and specific embodiments. Advantages and features of the present invention will be apparent from the following description and claims. It should be noted that all the drawings are in a very simplified form and use imprecise scales, and are only used to facilitate and clearly assist the purpose of illustrating the embodiments of the present invention.

[0032] The core idea of ​​the present invention is to provide a module lens testing method and system to overcome the defects in the prior art that SFR measurement is a simplified version of MFT and requires frequent replacement frequency and re-obtaining different resolution diagrams.

[0033] In order to realize the above idea, the present invention provides a method and system for testing a module lens. The method for testing a module lens includes: a captur...

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Abstract

The invention provides a module lens test method and system. The module lens test method comprises that a capture unit captures images formed after lens resolution to form a resolution power picture; the capture unit carries out sampling on edges of a frame in the resolution power picture to form a plurality of sampling points; a processing unit carries out black and white contrast on the grayscale of the sampling points and forms a data fitting curve; and the processing unit carries out Fourier calculation on the data fitting curve and obtains a spatial frequency response value of a lens. The module lens test method and system realize fully-automatic module lens test; and since the processing unit carries out sampling and processing, that is, Fourier calculation, on the data fitting curve automatically, automatic processing of resolution power high-frequency test of the module lens can also be realized, and manual interpretation is not needed; and the module lens test method and system are suitable for full-range (low-frequency, intermediate-frequency and high-frequency ) resolution power test.

Description

technical field [0001] The invention relates to the field of image technology, in particular to a method and system for testing a module lens. Background technique [0002] Modulation Transfer Function (MTF for short) is a relatively scientific method for analyzing lens resolution at present. The MTF method can judge the resolution of cameras and lenses. However, the MTF test chart composed of pure lines is essentially limited by the output The limit of the equipment, when the digital single-lens reflex camera with up to 10 million pixels is launched, such as: Nikon D2X or Canon EOS 1Ds MKII, etc., its shooting resolution has surpassed the performance of traditional film (in the past, the definition of traditional 135mm film is about 1000 pixels ). In other words, when the progress of the equipment begins to exceed the limits of USAF1951 and ISO12233, the relative significance of this test has ceased to exist. Therefore, MTF has been developed for several decades, and the ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01M11/02
CPCG01M11/0292
Inventor 刘玉波徐青
Owner HUA WEI SEMICONDUCTOR (SHANGAHAI) CO LTD
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