A test-aware mapping method for network-on-chip NOCs
A network-on-chip, mapping method technology, applied in data exchange networks, digital transmission systems, electrical components, etc., can solve problems affecting application program execution, increase test frequency, etc., to improve reliability, reduce system delay, and prevent regional fragmentation the effect of
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[0021] The technical solution of the present invention will be further described in detail below in conjunction with the accompanying drawings, but the protection scope of the present invention is not limited to the following description.
[0022] like figure 1 As shown, a test-aware mapping method for a network-on-chip NoC, including the following steps:
[0023] S1. Determine the mapping head node: determine the mapping head node according to the number of idle adjacent nodes, the number of measurable links and the distance from the control node of each node in the network-on-chip NoC; wherein, the step S1 includes the following sub-steps: S101. According to the number of idle neighbor nodes of each node in the network on chip NoC, screen the nodes of the network on chip NoC; determine whether the screening result is unique, if so, directly use the node as the mapping first node; if not, add the screening result to the preliminary screening node set ; S102. According to the...
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