A test-aware mapping method for network-on-chip NOCs

A network-on-chip, mapping method technology, applied in data exchange networks, digital transmission systems, electrical components, etc., can solve problems affecting application program execution, increase test frequency, etc., to improve reliability, reduce system delay, and prevent regional fragmentation the effect of

Active Publication Date: 2019-09-03
UNIV OF ELECTRONICS SCI & TECH OF CHINA
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] With the rapid development of sub-micron technology, intermittent faults have gradually become one of the limiting factors to achieve high reliability of the network-on-chip (NoC); and the detection of intermittent faults requires increased test frequency, which will affect the application. implement

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  • A test-aware mapping method for network-on-chip NOCs
  • A test-aware mapping method for network-on-chip NOCs
  • A test-aware mapping method for network-on-chip NOCs

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Embodiment Construction

[0021] The technical solution of the present invention will be further described in detail below in conjunction with the accompanying drawings, but the protection scope of the present invention is not limited to the following description.

[0022] like figure 1 As shown, a test-aware mapping method for a network-on-chip NoC, including the following steps:

[0023] S1. Determine the mapping head node: determine the mapping head node according to the number of idle adjacent nodes, the number of measurable links and the distance from the control node of each node in the network-on-chip NoC; wherein, the step S1 includes the following sub-steps: S101. According to the number of idle neighbor nodes of each node in the network on chip NoC, screen the nodes of the network on chip NoC; determine whether the screening result is unique, if so, directly use the node as the mapping first node; if not, add the screening result to the preliminary screening node set ; S102. According to the...

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Abstract

The invention discloses a test-aware mapping method for a network on chip NoC, which includes the following steps: S1. Determine the mapping head node: according to the number of idle adjacent nodes, the number of measurable links and the connection with the control node of each node in the network on chip NoC Determine the distance to map the first node; S2. Perform task mapping: regard the application program of the network-on-chip NoC as a group of communication tasks, sort the communication tasks according to the traffic volume, and form a task queue, starting from the first node, according to deterministic mapping Policies map sets of communication tasks for an application. The present invention provides a test-aware mapping method for network-on-chip (NoC), which prevents regional fragmentation, reduces congestion probability, avoids links occupied by test-use mapping, reduces system delay, and balances communication distance and regional adjacency Spend.

Description

technical field [0001] The present invention relates to a network on chip, in particular to a test perception mapping method for a network on chip NoC. Background technique [0002] The core idea of ​​network-on-chip (NoC) is to introduce computer network technology into chip design, and completely solve the bottleneck problem of on-chip communication from the perspective of architecture. With the advancement of technology and the development of integrated circuit technology, the integration of chips is getting higher and higher, and there are more and more new embedded systems. The original single-core processor can no longer meet the requirements of high-performance and high-frequency embedded systems. requirements; therefore, the multi-core system on a chip has become an ideal choice; the multi-core system on a chip integrates multiple processors or functional modules into one chip, and is widely used because of its advantages in processing performance, power consumption,...

Claims

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Application Information

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Patent Type & AuthorityPatents(China)
IPC IPC(8): H04L12/733H04L12/727H04L12/721H04L12/933H04L12/26H04L45/122H04L45/121
CPCH04L43/50H04L45/121H04L45/122H04L45/124H04L45/126H04L49/109
Inventor姜书艳武琼陈姝燏黄乐天
OwnerUNIV OF ELECTRONICS SCI & TECH OF CHINA