Dynamic stress accelerated life test profile compilation method
An accelerated life test, dynamic stress technology, applied in special data processing applications, instruments, electrical digital data processing, etc., can solve the problems of insignificant acceleration effect and difficult to guarantee consistency.
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0056] Step 1: Statistically analyze the measured data of dynamic temperature stress to determine the temperature mean value T of the periodic function m , temperature amplitude T a , the cycle period w and the value of the coordination parameter b.
[0057] Analyze the measured dynamic temperature stress data, and according to the seasonal change law of temperature environmental stress, fit the dynamic temperature stress data into a chord function with a period of 1 year, and determine the temperature mean value T of the periodic function m , amplitude T a , the cycle period w and the value of the coordination parameter b. For example, the monthly average temperature stress data of a place for five consecutive years is shown in Table 1, and the fitted expression is:
[0058]
[0059] Table 1 Statistics of monthly average temperature stress in a place for 5 consecutive years (unit: K)
[0060]
[0061]
[0062] Step 2: According to the needs of the task, determine...
PUM

Abstract
Description
Claims
Application Information

- Generate Ideas
- Intellectual Property
- Life Sciences
- Materials
- Tech Scout
- Unparalleled Data Quality
- Higher Quality Content
- 60% Fewer Hallucinations
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2025 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com