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Wide-range voltage and high-current output method and power system

An output method and a technology of output power, applied in the direction of DC power input conversion to DC power output, control/regulation system, output power conversion device, etc., can solve the problem of circuit loop instability and failure to meet non-isolated power supply, module output Accuracy/ripple/dynamic response characteristics are difficult to meet the requirements of the load chip, etc., to achieve the effect of optimizing ripple and accuracy indicators and stabilizing output

Pending Publication Date: 2019-02-12
武汉精鸿电子技术有限公司
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Problems solved by technology

It cannot meet the demand above 6V, and forced voltage regulation will cause the inductance parameters to be mismatched, which will lead to the instability of the circuit loop. At the same time, the output accuracy / ripple / dynamic response characteristics of the module are difficult to meet the requirements of the load chip.
Patent document CN201620110801.8 discloses an AC-DC (AC-to-DC) switching power supply to achieve a wide output voltage through filtering-rectification, but this solution is not suitable for the application environment of DC-DC, and cannot meet the requirements for wide output voltage. Demand for non-isolated power supplies with high voltage and high current

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  • Wide-range voltage and high-current output method and power system
  • Wide-range voltage and high-current output method and power system

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Embodiment Construction

[0028] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.

[0029] In addition, the technical features involved in the various embodiments of the present invention described below can be combined with each other as long as they do not constitute a conflict with each other. The present invention will be further described in detail below in combination with specific embodiments.

[0030] For the convenience of introducing the content of the invention, the definitions and explanations of related terms are as follows:

[0031] ATE: Automatic Test Equipment automatic test equipment;

[0032] DUT: Device Under Test tested device;

[0033] DPS: Device Power Sup...

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Abstract

The invention discloses a wide-range voltage and high-current output method and a power system. Voltage and current are provided for a first MOS (metal oxide semiconductor) tube by a standard buck circuit; conduction impedance of the first MOS tube is adjusted according to a comparison result of an output feedback voltage VFB of the first MOS tube and a preset target voltage Vset, operation of thefirst MOS tube in a transverse flow area is realized, and accordingly wide-range voltage and high-current stable output of the power system is realized, and the problem of a narrow adjustable range of current non-isolated module output voltage is solved. In addition, the problem of high output voltage fluctuation under the condition of large-range dynamic changes of output current is solved, andripple and precision indexes of wide-range output power sources are optimized.

Description

technical field [0001] The invention belongs to the field of power supply design, and in particular relates to a wide-range voltage and large current output method and a power supply system. Background technique [0002] With the development of materials, processes and other technologies, the scale of IC integrated circuits is getting larger and larger, and the application of semiconductor devices in communication, computer, medical and other fields is becoming more and more extensive. Then the ATE (Automatic Test Equipment, automatic test equipment) system It is very important to test the indicators, functions and reliability of semiconductors. The ATE system is mainly composed of a host computer, a core board, and a DIB (Device Interface Board, the device interface board under test) board. The test program is loaded through the host computer and runs on the core board to generate appropriate voltage / current / timing / function status signals. , send the signal to the DUT (Dev...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H02M3/158
CPCH02M3/1582
Inventor 魏海波邓标华唐文天裴敬孟杨丁浩
Owner 武汉精鸿电子技术有限公司
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