A method and device for processing quantum measurement and control data

A data processing and quantum technology, applied in electrical digital data processing, special data processing applications, instruments, etc., can solve the problems of high oscillation frequency of measurement data, difficult processing, unstable waveform, etc., to narrow the gap and improve work efficiency , the effect of improving the accuracy

Pending Publication Date: 2019-03-08
HEFEI ORIGIN QUANTUM COMP TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0006] Aiming at the problem that the existing measurement data has high oscillation frequency, relatively unstable waveform and large noise, the processing is difficult and the processed data is inaccurate. The present invention provides a method and device for processing quantum measurement and control data; the present invention realizes It improves the denoising of quantum measurement and control data, and improves the accuracy of the data obtained after denoising

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  • A method and device for processing quantum measurement and control data
  • A method and device for processing quantum measurement and control data
  • A method and device for processing quantum measurement and control data

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Embodiment 1

[0074] This embodiment provides a quantum measurement and control data processing method, figure 1 It is a flowchart of a quantum measurement and control data processing method according to an embodiment of the present invention, such as figure 1 As shown, the process includes the following steps:

[0075] Step S101: Obtain the distribution map of the quantum measurement and control data;

[0076] Step S102: According to the distribution diagram, it is judged that the distribution of the quantum measurement and control data conforms to the functional relationship;

[0077] Step S103: If it is judged that the distribution of the quantum measurement and control data does not conform to the functional relationship, perform gradient noise reduction processing on the quantum measurement and control data; if it is determined that the distribution of the quantum measurement and control data conforms to the functional relationship, then pair the quantum The measurement and control d...

Embodiment 2

[0122] This embodiment provides a quantum measurement and control data processing method, and the specific implementation method is the same as that of Embodiment 1. The difference lies in that the present invention will be illustrated below in conjunction with the specific implementation mode of this embodiment.

[0123] This specific embodiment is aimed at quantum measurement and control data A, which is three-dimensional data and stored in the form of (x, y, z). When performing data processing, the details are as follows:

[0124] Step S201, using the m1tplotlib open source module to plot the 3D data A to obtain a distribution diagram of the 3D data; wherein: the distribution diagram includes a 3D diagram and / or a 2D diagram. A three-dimensional graph refers to a graph that can reflect the three characteristics of X, Y, and Z sequences at the same time. It can be represented by a spatial three-dimensional graph, or a spatial two-dimensional plane graph with other features, ...

Embodiment 3

[0166] This embodiment provides a quantum program processing device, which is used to implement the above embodiments and preferred implementation modes, and those that have already been described will not be described in detail. As used below, the term "module" may be a combination of software and / or hardware that realizes a predetermined function. Although the devices described in the following embodiments are preferably implemented in software, implementations in hardware, or a combination of software and hardware are also possible and contemplated.

[0167] Figure 10 is a structural block diagram of a quantum measurement and control data processing device according to an embodiment of the present invention, such as Figure 10 As shown, the quantum measurement and control data processing device includes: the first acquisition module 11, which is used to obtain the distribution diagram of the quantum measurement and control data; the first judgment module 12, which is used...

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Abstract

The invention discloses a method and device for processing the quantum measurement and control data, belonging to the technical field of the quantum measurement and control. The method includes the following steps of obtaining the distribution map of the quantum measurement and control data; judging a functional relationship of distribution coincidence of the quantum measurement and control data according to the distribution map; if it is judged that the distribution of the quantum measurement and control data does not coincide with the function relation, subjecting the quantum measurement andcontrol data to gradient noise reduction processing; if it is judged that the distribution of the quantum measurement and control data coincides with the functional relation, subjecting the quantum measurement and control data to the function fitting and noise reduction processing according to the function model corresponding to the functional relation. The invention realizes the denoising of thequantum measurement and control data, and improves the accuracy of the data obtained after denoising.

Description

technical field [0001] The invention belongs to the field of quantum measurement and control, and in particular relates to a method and device for processing quantum measurement and control data. Background technique [0002] In the manufacture of quantum chips, it is necessary to test the quantum chips. Usually, a network analyzer is used to collect test data. On the one hand, the collected data is stored as measurement and control data. presented in a form for observation. In the later stage, the stored measurement and control data can be processed and utilized to understand the physical and mathematical meaning behind the data. It is even possible to construct a corresponding model and use the model to predict the future development of the data. [0003] Generally, the shock wave presented in the network analyzer during quantum measurement and control has the characteristics of high oscillation frequency, relatively unstable waveform and large noise. According to the cha...

Claims

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Application Information

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IPC IPC(8): G06F17/50
CPCG06F2119/10G06F30/20Y02P90/02
Inventor 石汉卿郭芬张昂孔伟成
Owner HEFEI ORIGIN QUANTUM COMP TECH CO LTD
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