Self-protection test probe with protection function and manufacturing method thereof

A technology of protective function and production method, which is applied in the field of self-protection test pens, can solve problems such as test head damage and test piece scratches, and achieve the effects of preventing probe damage, preventing circuit breakage, and ensuring reliability

Active Publication Date: 2019-04-26
XIAN MICROELECTRONICS TECH INST
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0002] At present, the existing test leads of multimeters are all pointed or fixed thick with φ>1mm. There are two problems in the use of this kind of test leads. During the test, the thick-headed test leads tend to interfere with the test point, and the sharp-pointed test leads may cause scratches on the test piece if the force is improper; causing damage to its test head

Method used

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  • Self-protection test probe with protection function and manufacturing method thereof
  • Self-protection test probe with protection function and manufacturing method thereof
  • Self-protection test probe with protection function and manufacturing method thereof

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Embodiment Construction

[0035] The present invention will be further described in detail below in conjunction with the accompanying drawings, which are explanations rather than limitations of the present invention.

[0036] The design principle of the present invention has two points. First, use the retractable function of the probe and the round head design of the probe probe to prevent the damage to the tested piece due to the excessive force of the test operator during the test, so as to achieve the correctness of the tested piece. The protection function of the parts during the test, specifically, using the round head test probe of φ0.3~φ0.6mm to test the small test point of 0.5mm≤φ≤1mm can also avoid interference on the test point; second, Take anti-break measures, use the card cap, pen head and card head to protect the retractable test probe, prevent the probe from bending due to improper force during use, and thus play a self-protective role in the retractable test probe; It effectively solves...

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Abstract

The invention provides a self-protection test probe with a protection function and a manufacturing method thereof. In the test probe, a clamping cap is fixed at the front end of a probe barrel, an endcap, the probe barrel, a probe head and a clamping head are coordinated to form a test probe body in turn, and a probe of a telescopic test probe is circular with a diameter of 0.3-0.6 mm; a test line penetrates through the end cap, the front end is arranged in the probe barrel, the telescopic test probe penetrates through the clamping head and probe head, the probe extends out the clamping head,the end is set in the barrel barrel, the test line is communicated with the telescopic test probe, the communicated part is fixed in the clamping cap, and the clamping cap, the probe head and the clamping head are used for protecting the telescopic test probe; according to the method, a line input end of the test line is communicated with the telescopic test probe, the end cap of an automatic pencil is slotted, the end cap and the probe barrel of the automatic pencil penetrate through the test line, by expanding a slot on the clamping cap of the automatic pencil, the communicated part of thetest line of the telescopic test probe and a test instrument can be fixed, and finally, the test probe can be assembled.

Description

technical field [0001] The invention relates to the field of test tools, in particular to a self-protection test pen with protection function and a manufacturing method thereof. Background technique [0002] At present, the existing test leads of multimeters are all pointed or fixed thick with φ>1mm. There are two problems in the use of this kind of test leads. During the test, the thick-headed test leads tend to interfere with the test point, and the sharp-pointed test leads may cause scratches on the test piece if the force is improper; cause damage to its test head. Contents of the invention [0003] Aiming at the problems existing in the prior art, the present invention provides a self-protection test pen with protection function and its manufacturing method, which is convenient and efficient, and can effectively protect the tiny test points of 0.5mm≤φ≤1mm from forming during the test process. Interference or damage, and can effectively avoid damage to small-diame...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R15/12G01R1/067
CPCG01R1/06705G01R1/06711G01R15/12
Inventor 苏会侠王亮
Owner XIAN MICROELECTRONICS TECH INST
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