A test method and device

A test method and test point technology, applied in the computer field, can solve problems such as product failure

Active Publication Date: 2021-01-15
SUZHOU METABRAIN INTELLIGENT TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, there are cases where even if the test is passed, the product may malfunction due to the actual interference level exceeding the standard level

Method used

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  • A test method and device
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  • A test method and device

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0092] Before explaining the technical solution of the present application, the terms involved are firstly introduced.

[0093] 1) The concept and comparison method of product failure phenomenon and EMS phenomenon.

[0094] Server products sold to customers, after long-term work, sometimes experience power failure, restart, data loss, board parts burnout, etc., which are called product failures.

[0095] During the EMS test, the product under test may sometimes experience power failure, restart, data loss, and burnout of board components, which are called EMS phenomena.

[0096] 2) Concepts of suspected problem sources, fault time-domain waveforms and EMS time-domain waveforms, and comparative analysis methods.

[0097] After a product fails, the engineer will first conduct time-domain measurement and investigation to check whether there is an abnormality in the key power supply and signal when the problem occurs. When an abnormal time-domain waveform is measured, for exampl...

example 1

[0205] Such as Figure 4 As shown, the test method of the present application is further described below through specific examples. The test methods for this example include:

[0206] Step S200, when the server fails during use, determine the source of the current suspected problem;

[0207] Step S201, judging whether the server has passed the first EMS test, if the server fails the first EMS test, execute step S202; if the server passes the first EMS test, execute step S210;

[0208] Step S202, performing a second EMS test on the server;

[0209] Step S203, judging whether the fault disappears during the second EMS test; if the fault disappears during the second EMS test, execute step S204; if during the second EMS test If the failure does not disappear, turn to step S212 and start to execute;

[0210] Step S204, acquiring the first time-domain waveform and the second time-domain waveform;

[0211] Step S205, judging whether the absolute value of the difference of the se...

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Abstract

The present application provides a test method and device. When a server fails, by comparing the time-domain waveforms during the EMS test, it can be determined whether the server failure is related to EMS interference.

Description

technical field [0001] The invention relates to the field of computers, in particular to a testing method and device. Background technique [0002] The time domain is the real world we experience, in which high-speed signals operate, and evaluation of signal performance is usually performed in the time domain, because the performance of products is ultimately measured in the time domain. A representative measuring instrument in the time domain is an oscilloscope. EMS (Electro Magnetic Susceptibility, electromagnetic immunity) test items include electrostatic immunity, lightning surge immunity, electrical fast burst immunity, power frequency magnetic field immunity, radiation immunity, conduction immunity Degree, etc., EMS items are usually analyzed and measured in the frequency domain. But it is easier to analyze and describe some problems in the frequency domain than in the time domain. For example, bandwidth is a concept in the frequency domain, which can be used to desc...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06F11/22G01R31/00
CPCG06F11/2273G01R31/001G01R31/002G06F11/26
Inventor 党杰
Owner SUZHOU METABRAIN INTELLIGENT TECH CO LTD
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