Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Automatic test analysis processing method and device, computer device and storage medium

A technology for automated testing, analysis and processing, applied in the field of computer equipment and storage media, devices, and automated testing analysis and processing methods, and can solve problems such as no objective data support and high quality risks.

Pending Publication Date: 2019-05-17
ONE CONNECT SMART TECH CO LTD SHENZHEN
View PDF0 Cites 11 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] The embodiment of the present invention provides an automated test analysis and processing method, device, computer equipment, and storage medium to solve the problem that the interface test process of the current software version has no objective data support and causes a relatively high quality risk

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Automatic test analysis processing method and device, computer device and storage medium
  • Automatic test analysis processing method and device, computer device and storage medium
  • Automatic test analysis processing method and device, computer device and storage medium

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0028] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are some of the embodiments of the present invention, but not all of them. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without creative efforts fall within the protection scope of the present invention.

[0029] The automated test analysis and processing method provided by the embodiment of the present invention, the automated test analysis and processing method can be applied such as figure 1 shown in the application environment. Specifically, the automated test analysis and processing method is applied in an automated test platform, and the automated test platform includes such as figure 1 As shown in the client and server, the client and the server ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses an automatic test analysis processing method and device, a computer device and a storage medium. The method comprises the steps of obtaining a test analysis request, wherein the test analysis request comprises a target system identifier and a target test period; querying a corresponding interface document library based on the target system identifier, and obtaining a totalinterface number corresponding to standard interface data in the interface document library; querying a corresponding test database based on the target system identifier, and obtaining the number of tested interfaces corresponding to the test interface data in the target test period; calculating the total interface number and the tested interface number by adopting a coverage rate formula to obtain an interface coverage rate; and if the interface coverage rate is smaller than a coverage rate threshold value, acquiring missed test interface data based on the test interface data and standard interface data in the interface document library. According to the method, the objectivity of the determined missed test interface can be verified, so that the objectivity and the test quality of testingbased on the missed test interface are ensured.

Description

technical field [0001] The invention relates to the field of software testing, in particular to an automatic testing analysis and processing method, device, computer equipment and storage medium. Background technique [0002] In the process of software development, it is necessary to test the software version formed at each stage of software development to check whether the software version has defects and errors, and to verify whether the software version is consistent with its instruction manual and user manual. Or, during the development of a new software version, when the developer modifies the old code in the original software version, re-testing is required to confirm whether the modification produces new errors or causes errors in other codes. During the testing process of the above software version, it is necessary to test the interface contained in the software version to ensure that the software version can realize the front end (usually the client) to access the b...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/36
Inventor 余艳萍徐从国叶松刘建华
Owner ONE CONNECT SMART TECH CO LTD SHENZHEN
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products