171results about How to "Guaranteed test quality" patented technology

The invention relates to a device and a method for testing the bending property of a joint for welding and connecting dissimilar materials, and solves the problem that the center of a welding line of a test piece and a pressure head cannot be always kept on the same vertical surface according to the test requirement during test operation of a universal testing machine. The technical scheme is that: two wing plates are symmetrically distributed on two supporting rollers of the device to support the dissimilar metal test piece and prevent the test piece from moving left and right in the bendingprocess; meanwhile, the two wing plates have functions of winding and guiding, so that the test piece is wound on the edge of the pressure head; the supporting wing plates can do arc movement with the test piece along tail end shafts of supporting plates in the testing process; and the test piece and the pressure head can be always kept on the same axis under the action of two supporting plates and a fastening system thereof. Through the method and the device, the dissimilar materials with large difference in physical properties can also be tested by the conventional universal mechanical testing machine, so that the test quality of the bending mechanical property of the joint for welding and connecting the dissimilar materials by using the universal testing machine is improved to a great extent, and time and economic cost are greatly saved.

The invention belongs to the technical field of testing and relates to a performance degradation testing method of an insulated gate bipolar transistor. According to the method, the insulated gate bipolar transistor is taken as an object, a programmable pulse generator, a programmable electronic switch, a programmable digital universal meter, a power resistor, a working resistor and a direct current power supply are utilized, and offset values of conduction saturation voltage of the insulated gate bipolar transistor along with the impact number of times of short-circuit current under different short-circuit current values can be obtained through short-circuit current impact and further used as performance degradation data of the insulated gate bipolar transistor. According to the method, the accurate performance degradation data of the insulated gate bipolar transistor caused by short-circuit current can be obtained within a short period of time, and the data can be utilized for accurately predicting the failure time of the insulated gate bipolar transistor in the using process so as to take measures in time before the failure of the insulated gate bipolar transistor, prevent serious faults caused by the failure of the insulated gate bipolar transistor and further reduce the economic loss.

The invention supplies program test system and method used to increase program testing efficiency. The method includes the following steps: positioning tested function of the tested program to finish once turning required configuration item; identifying main invoking function and invoked function; controlling the current invoking of the main invoking function to turn to testing special function; invoking corresponding testing special function to test according to the current invoking turning control of the turning control sub-module. The invention also support testing evaluating form based on function invoking, customizable standard. The invention is helpful to software developing especially for C language, can greatly increase line up working efficiency, testing operation usability, and test quality.

The invention relates to an avionic software simulation comprehensive test and verification platform. Through the platform, a test level selection module, a document investigation module, a code investigation module, a dynamic test module, a model test module and a cloud service are built for test personnel according to a business sequence of project approval, demand analysis, project planning, project implementation and project summarization, wherein the test level selection module is used for selecting levels of to-be-tested targets; the document investigation module is configured with a document test tool corresponding to the levels of the to-be-tested targets so as to carry out document investigation on the to-be-tested targets; the code investigation module is configured with different types of automatic code test tools so as to test codes of the to-be-tested targets; the dynamic test module is used for setting corresponding test systems according to the levels of the to-be-testedtargets; the model test module is configured with an automatic model test tool; and the cloud service is used for uploading test process data and management data to a network platform.

Embodiment of the present invention provides a device and method for testing target recognition device. The device includes a test host, a display and a capture machine coupled to the test host. The display is configured to display a test image, and a target recognition device identifies the target in the test image and outputs a recognition image. The capture machine is used to capture the targetin the recognition image, and output the captured image to the test host. The test host is configured to judge whether the target recognition device is working normally based on at least the test image and the captured image. The above device and method can copy the target recognition device for a long time. Thereby, the demand for human resources can be greatly reduced, the labor cost can be saved, and the test efficiency of the target recognition device can be effectively improved. In addition, the above device and method can avoid human error that may occur due to manual testing, thus canbetter ensure the quality of the test.

The invention discloses a method for confirming position alignment in wafer test, comprising the following steps: (1) the position of an address Z in a chip memory area is specified as the position of storage mapping address, wherein a chip contains a chip status flag; (2) in the first test process, a tester reads information of a chip position A on a wafer from a prober system, and corresponding mapping relations are written into corresponding chips on the wafer through the tester; (3) in the second and subsequent process test, the chip position A read from the prober system is compared with a position A' read from a target chip, alarming is carried out through the tester if the two positions are not the same, and subsequent test continues if the two positions are consistent. Position alignment offset in multi-process test is avoided, the wafer test time is saved, and the quality of wafer test is guaranteed to the maximum.

The invention discloses an automatic test analysis processing method and device, a computer device and a storage medium. The method comprises the steps of obtaining a test analysis request, wherein the test analysis request comprises a target system identifier and a target test period; querying a corresponding interface document library based on the target system identifier, and obtaining a totalinterface number corresponding to standard interface data in the interface document library; querying a corresponding test database based on the target system identifier, and obtaining the number of tested interfaces corresponding to the test interface data in the target test period; calculating the total interface number and the tested interface number by adopting a coverage rate formula to obtain an interface coverage rate; and if the interface coverage rate is smaller than a coverage rate threshold value, acquiring missed test interface data based on the test interface data and standard interface data in the interface document library. According to the method, the objectivity of the determined missed test interface can be verified, so that the objectivity and the test quality of testingbased on the missed test interface are ensured.

The invention relates to the technology of application layer testing, and discloses a UI automatic testing method of intelligent appliance application, aiming at solving the problems of complicated operation and low efficiency of intelligent equipment application layer testing in the traditional technology. The method comprises the following steps of: A, writing testing steps by using a scripting language, and saving; B, first determining whether an executable test suite exits or not locally during an automatic test, selecting an existing test suite if so, otherwise creating a test suite, and saving under a designated directory of an upper computer test platform of PC; C, checking if test configuration is completed or not, executing the test suite after test configuration is completed for automatic testing; and D, automatically generating a test report by the testing platform.

The invention provides a rapid cultivation device and method of a daphnia magna laboratory and belongs to the field of cultivation of zooplankter. The rapid cultivation device comprises supports, base plates, water bath tanks, a water storage tank, cultivation cups, heating rods, thermometers, turbulence pumps, a fluorescent lamp and a time controller. Each base plate is arranged at the bottom of the corresponding support. The storage water tank is arranged on the base plate of the bottommost support. The water bath tanks are arranged on the base plates of the two upper supports. One thermometer, one turbulence pump and two heating rods are arranged in the water storage tank. Each water bath tank is provided with one thermometer, two heating rods and six cultivation cups. The fluorescent lamp is located above the portion deviating from the center of the support and is parallel to the support. The time controller is in contact with the fluorescent lamp. The rapid cultivation device is easy and convenient to operate, high in operability, easy to set up and free of a complicated device structure. Daphnia magna cultivated through the rapid cultivation device is rapid in reproduction and large in quantity, the life condition of the daphnia magna is stable, and the individual difference of the daphnia magna is small, so that results of toxic tests of fleas are stable and reliable, the test quality is guaranteed, and enough test materials can be provided for tests such as removal of zooplankter pollution to water in the industry of water treatment at the same time.

The invention relates to a cross-platform station automatic monitoring system testing method based on concurrency simulating tools. Two-stage concurrency simulating tools are adopted to finish high-efficiency test, i.e. a 103 scale protocol simulating tool and an LR load pressure testing tool. The testing method realizes the purpose of constructing a large-scale station automatic monitoring system testing environment by using a minimized device emulation computer simulating tool and ensures that a station spacer layer is virtualized into a data transmission request processing center of a single similar clouding computing by adopting several computers, thereby the systematic difference characteristic of the cross-platform monitoring system of a ground shielding station control layer is maximized. The invention can solve many problems caused by the traditional simple mechanical laboratory test mode and realize high-efficiency, reliable and long-term stability simulation test of the cross-platform station automatic monitoring system.

The invention relates to the technical field of scenario testing, discloses an internet-of-things device scenario testing method, and solves the problem that coverage testing cannot be carried out comprehensively and effectively by existing internet-of-things device scenario testing. The internet-of-things device scenario testing method disclosed by the invention comprises the steps of selecting a model of a to-be-tested internet-of-things device by an upper computer, finding a network protocol library corresponding to the model of the to-be-tested internet-of-things device in a database, and automatically generating a corresponding interface button; connecting the upper computer to a network environment which needs to be tested via WIFI; clicking the interface button, configuring parameters of each interface according to the environment needed by a testing case and finally encapsulating the parameters into a network packet to send out; and after receiving the network packet sent by the upper computer by the to-be-tested internet-of-things device, analyzing contents in the network packet, calling the corresponding interface for the scenario testing and reporting a state. The internet-of-things device scenario testing method disclosed by the invention is applied to the scenario testing of the internet-of-things device.

The invention discloses a test case processing method and device. The method comprises the following steps of under the condition that a mind map file case is received, analyzing the mind map file case to generate a test case; determining whether the test case is an incomplete case or not by performing integrity detection on the test case; when it is determined that the test case is the incompletecase, determining that the test case is a complete case, wherein the incomplete use case at least comprises a use case which does not meet the format requirement of the test case, and the format of the test case at least comprises one of a use case module, a use case name, a use case condition, a use case step and an expected result. The technical problems that an existing test case processing method is low in readability and executive property of the test case, are solved.

The invention relates to a microcomputer relay protection simulation system, and in particular relates to a simulation system of a microcomputer relay protection logical test signal system. The simulation system of the microcomputer relay protection logical test signal system comprises a comprehensive protector, a switch which is connected with the comprehensive protector to form a circuit and a secondary circuit signal system of the switch, and the simulation system of the microcomputer relay protection logical test signal system also comprises a signal power supply, wherein the signal power supply, the switch and the secondary circuit signal system of the switch are connected with the comprehensive protector in parallel. The simulation system provided by the invention can realize simulation on working conditions, a control loop and a secondary signal environment of the switch in a relay protection secondary circuit, thus an application logical program test of the comprehensive protector can be changed into a laboratory simulation test from field measurement.

The invention discloses a PCBA automatic parallel insulation and voltage resistance testing system and device. The system disposed on the device comprises a product identification module for obtaining the information of a PCBA to be tested; a program loading module for loading a corresponding product testing program according to the information of the PCBA to be tested; and a product testing module for outputting an instruction according to the product testing program to drive a routing matrix switch in the device to switch and to control an insulation and voltage resistance tester in the device to output corresponding test voltage. Every time the product testing module drives the routing matrix switch to switch, two circuits with different voltage classes are selected on the PCBA to be tested to communicate with the output end of the insulation and voltage resistance tester so as to receive the test voltage output by the insulation and voltage resistance tester for an insulation and voltage resistance test.

The invention belongs to the technical field of wind power generation, and particularly relates to a fan variable pitch driver automatic testing system. The automatic testing system is applied to in-plant testing for an alternating current servo driver of an electric variable pitch system of a large wind turbine unit, and is mainly composed of a PLC (1), a test driver (2), a tested driver (3), a supercapacitor group (4), a motor I (5) a motor II (6), a capacitor charging and discharging resistor (7), a Hall sensor (9), a bus connection relay switch (10), a capacitor charging relay switch (11), a capacitor discharging relay switch (12) and a capacitor power supply relay switch (13). The automatic testing system is mainly applied to automatic detection for hardware functions and overall performance of a fan variable pitch driver. The automatic testing system not only can complete testing work for the variable pitch driver quickly and effectively, but also reduces requirements for the operating personnel and optimizes the human resource cost.

The invention discloses a train display software testing method, device and system. The method comprises the following steps: executing an automatic test script in a configuration file according to the read configuration file of the automatic test software; sending test data generated after the automatic test script is executed to the tested display; acquiring an interface image of the tested display in response to the test data, and matching the acquired interface image with a preset image template; and determining a test result of the automated test script according to a matching result. According to the scheme provided by the invention, the software testing efficiency and reusability can be improved, and the use is more convenient.

The invention provides a kit for detecting SARS-CoV-2 novel coronavirus nucleic acid at a constant temperature by using an enzyme digestion probe. The kit comprises an isothermal amplification primerfor detecting an ORF1ab gene of SARS-CoV-2 novel coronavirus and a corresponding RNA-containing base probe capable of being digested by RNase H, wherein the left end and the right end of an RNA base of the base probe are respectively marked with a reporter fluorophore and a quencher. By utilizing the efficient isothermal amplification primer and the probe, constant-temperature multiple detection can be carried out on the SARS-CoV-2 novel coronavirus, and the kit has high sensitivity and high specificity. The novel coronavirus nucleic acid detection kit disclosed by the invention has high sensitivity and specificity, can be used for detecting throat swabs, alveolar lavage fluid and sputum samples of suspected novel coronavirus pneumonia cases, suspected aggregated case patients and other patients needing novel coronavirus infection diagnosis or differential diagnosis, and has the characteristics of simplicity, convenience, quickness and accuracy.

The invention disclose an integrated Bluetooth automatic testing system which comprises a mainframe box. A monitoring displayer is arranged at one side of the mainframe box. A single discharging braiddevice is arranged at the position, close to one side, of the front part of the mainframe box, a red, green and yellow alarm lamp is welded to the position, close to one corner of the rear end, of the outer surface of the upper end of the mainframe box, and an oil and water separator is fixedly installed at the position, close to one side of the lower end, of the outer surface of the front end ofthe mainframe box through a bolt. According to the integrated Bluetooth automatic testing system, firstly, Bluetooth chip signal shielding testing automation can be achieved, so that manual operations of operators are reduced, the production quality is improved, the production speed is increased, the chip testing efficiency is improved, the whole testing automation is achieved, the product testing quality is ensured, meanwhile, the worker cost can be saved, finally, a plurality of sets of chips can be measured at the same time, and the better using prospect is brought.

The invention discloses a device and a method for intelligently measuring joint bending angles of the welding and connection of dissimilar materials, and solves the problem that partial tests are unsuccessful because the conventional bending performance testing device cannot measure data of bending angles on site. The technical scheme is that: two symmetrical high-strength wing plates are arranged on two supporting rolls of the conventional three-point bending device so as to support a test piece and prevent the test piece from moving in the bending process; meanwhile, two precision bearing systems are introduced so as to construct a bending angle measurement device system which measures the bending angles of materials all the time in cooperation with a universal testing machine control system and a universal testing machine loading system. By the method and the device, the bending angles of welding materials can be directly obtained through the tests, the aim of controlling the tests by controlling the bending angles is fulfilled at the same time, and finally bending angle measurement tests are intelligently controlled so as to obtain reliable test data. The device improves measurement indexes of joint welding performance of material welding and connection of a universal testing machine, improves the accuracy of test data of the testing machine, and greatly saves time and economic cost.

The invention discloses a test case generation method, which comprises the steps of obtaining a configuration file of a software system, wherein configuration file comprises configuration items used for representing service logic, and matching each configuration item in the configuration file with a configuration rule table to obtain a value space corresponding to each configuration item; combining each configuration item in the configuration file to obtain a configuration item combination, traversing a value space corresponding to each configuration item in the configuration item combination,performing value combination to obtain all value combinations of the configuration item combination, calling a test case template, and generating a corresponding test case based on each value combination of the test case module and the configuration item combination. On one hand, the user operation is reduced, the test efficiency is improved, on the other hand, the coverage service scene is comprehensive, the missing test phenomenon is avoided, the test quality is ensured, and diversified test requirements can be met. The invention further discloses a corresponding device, equipment, a systemand a medium.

The embodiment of the invention discloses a system test method, a device, a computer device and a storage medium. The method comprises the following steps: if a system test instruction is received, obtaining at least one group of test data from a preset database according to a first preset rule, wherein the test data is used for testing the system under test; Judging whether the test data is matched with a preset configuration file, wherein the preset configuration file comprises data information matched with the system under test; If one set of test data matches the preset configuration file,stopping the system test and generating the corresponding error message. Completing the test if all test data does not match the preset configuration file. Based on the big data, the scheme can savethe time of constructing test data, simplify the process of using the related data to test the system, improve the test efficiency, and effectively ensure the test quality.

The invention provides a test method and a test system for port forwarding performance. The method comprises the steps as follows: S100, a first test terminal sends a request message to a forwarding terminal; S200, the first test terminal accesses a database of a second test terminal according to a port forwarding channel; and S300, the forwarding terminal records forwarding time and analyzing the forwarding time, and thus a port forwarding performance test is completed. According to the method and the system provided by the invention, the test is performed during a use process instead of being performed by a simulative forwarding process, close to practical application, and thus test quality is ensured. The operation is simple and convenient, test efficiency is improved, and test resources are saved.