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System test method, device, computer device, and storage medium

A system test and test data technology, applied in the field of data processing, can solve problems such as low test efficiency and complicated test process

Pending Publication Date: 2019-01-18
PINGAN PUHUI ENTERPRISE MANAGEMENT CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] The embodiment of the present invention provides a system test method, device, computer equipment and storage medium, aiming to solve the problem of complex test process and low test efficiency

Method used

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  • System test method, device, computer device, and storage medium
  • System test method, device, computer device, and storage medium
  • System test method, device, computer device, and storage medium

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Embodiment Construction

[0027] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are some of the embodiments of the present invention, but not all of them. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0028] It should be understood that when used in this specification and the appended claims, the terms "comprising" and "comprises" indicate the presence of described features, integers, steps, operations, elements and / or components, but do not exclude one or Presence or addition of multiple other features, integers, steps, operations, elements, components and / or collections thereof.

[0029] It should also be understood that the terminology used ...

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Abstract

The embodiment of the invention discloses a system test method, a device, a computer device and a storage medium. The method comprises the following steps: if a system test instruction is received, obtaining at least one group of test data from a preset database according to a first preset rule, wherein the test data is used for testing the system under test; Judging whether the test data is matched with a preset configuration file, wherein the preset configuration file comprises data information matched with the system under test; If one set of test data matches the preset configuration file,stopping the system test and generating the corresponding error message. Completing the test if all test data does not match the preset configuration file. Based on the big data, the scheme can savethe time of constructing test data, simplify the process of using the related data to test the system, improve the test efficiency, and effectively ensure the test quality.

Description

technical field [0001] The invention relates to the technical field of data processing, in particular to a system testing method, device, computer equipment and storage medium. Background technique [0002] The loan projects provided by the current third-party payment system are more and more closely cooperated with various banks. Among them, the lending bank provided by the third-party payment system for lending can support the bank cards of multiple banks as the lending bank card, but The supported lending bank cards also change frequently. In order to ensure that the third-party payment system can stably realize the loan process and complete the loan, it is necessary to aim at the changes in the lending bank card supported by the lending bank during the loan process, and construct the test data of the corresponding loan project to perform the card replacement process for the third-party payment system in-transit data verification. And if the lending bank stops lending t...

Claims

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Application Information

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IPC IPC(8): G06F11/36
CPCG06F11/3668
Inventor 张晓玲
Owner PINGAN PUHUI ENTERPRISE MANAGEMENT CO LTD
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