Method for rapidly measuring internal stress of nickel-based single crystal superalloy
A technology of nickel-based single crystal and high-temperature alloy, which is applied in the direction of measuring force, measuring devices, instruments, etc., can solve the problems of difficult sample measurement and low degree of automation, achieve fast counting and collection, and improve work efficiency.
Patent Information
- Authority / Receiving Office
- CN · China
- Current Assignee / Owner
- Publication Date
- 2019-07-23
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Abstract
Description
technical field
[0001] The invention belongs to the technical field of material performance testing, and relates to an X-ray-based method and device for rapidly measuring the internal stress of a nickel-based single crystal superalloy, which can realize rapid and automatic detection of complex samples. Background technique
[0002] As the material used for aeroengine turbine blades, the residual stress of nickel-based single crystal superalloys has been concerned. The existence of residual stress will affect the performance of the material itself, such as reducing fatigue life and recrystallization, so it is very important to quantitatively analyze the internal stress of nickel-based single crystal superalloy tubes. At this stage, most of the equipment used in the stress measurement of nickel-based single crystal superalloys is biased towards experimental research. Although the precision is high, the degree of automation is low, and it is difficult to measure samples with co...
Examples
Embodiment
[0055] Determination of surface stress after heat treatment of tetragonal nickel-based single crystal superalloy:
[0056] Take a nickel-based single crystal superalloy sample of a certain brand, such as figure 2 , the shape of the sample is a square, the size is 10mm×10mm×7mm, and the test surface is electrolytically polished. Then clamp it with the pneumatic gripper 2 so that the point to be measured is located at the SCP point.
[0057] The orientation of the test surface of the sample was determined, and the orientation was 6° away from the [110] orientation. Referring to the standard pole figure of [110], the {331} and {400} crystal plane families are selected as the determination crystal plane family. According to the standard diffraction card, the diffraction angle of the {331} crystal plane family is 139.540°, and {400} The diffraction angle of the crystal plane group is 119.200°.
[0058] The input parameter 2θ angle is 139.540°, 119.200°, the range of the input s...