11 results about "Pole figure" patented technology

A preparation method of a coaxial twin boundary atomic-scale HAADF-STEM sample based on a pole figure relates to the technical field of TEM sample preparation methods, and comprises the following steps: S1, pretreating a magnesium alloy material to prepare a sample for EBSD; s2, calibrating a single crystal grain in the sample prepared in the step S1 by using EBSD, carrying out pole figure analysis on a calibrated coaxial twin crystal interface, comparing with a standard {110} pole figure for judgment to obtain a {102} coaxial twin crystal boundary, recording the position of the {102} coaxial twin crystal boundary, and marking the {102} coaxial twin crystal boundary; s3, cutting the marked region in the step S2 by adopting an FIB technology, so as to obtain an atomic-scale HAADF-STEM sample; according to the method, the problems existing in existing EBSD characterization can be effectively avoided, the interface positioning efficiency is remarkably improved, the preprocessing time is shortened, and the reliability and repeatability of coaxial twin boundary identification are improved.

A system may obtain a plurality of experimental diffraction patterns. A system may identify a crystallographic orientation of each diffraction pattern of the plurality of experimental diffraction patterns. A system may build one or more pole figures. A system may select a reference spherical function having a reference frame. A system may correlate spherical images from the pole figures and the reference spherical function. A system may determine a sample frame of the crystallographic orientations. A system may rotate the crystallographic orientations of the plurality of experimental diffraction patterns into alignment with the reference frame to produce a plurality of rotated crystallographic orientations.

The application discloses a high-temperature alloy seed crystal cutting method, which comprises the following steps: firstly, a single crystal test plate with a near [001] orientation under space operation conditions is prepared; according to the position of a specific orientation point of a seed crystal to be prepared in a inverse pole figure, the direction angle θ and the φ angle of the orientation are calculated, and the θ and the φ are converted into corresponding angles in the Laue method by a formula; after the [001] direction is calibrated by a diffractometer and a three-axis rotating tool, the seed crystal with the specific orientation in the inverse pole figure is cut by using the calculated angles. The method adopts the single crystal plate with preparation conditions, utilizes a tool capable of rotating in three directions, realizes the cutting of the seed crystal with any orientation in the inverse pole figure, and simultaneously corresponds the rotating angles in the single crystal cutting to the angles in the existing general standard, namely, the Laue method for measuring crystal orientation, so that the seed crystal with any orientation in the inverse pole figure can be quickly and conveniently cut.

A system may obtain a plurality of experimental diffraction patterns. A system may identify a crystallographic orientation of each diffraction pattern of the plurality of experimental diffraction patterns. A system may build one or more pole figures. A system may select a reference spherical function having a reference frame. A system may correlate spherical images from the pole figures and the reference spherical function. A system may determine a sample frame of the crystallographic orientations. A system may rotate the crystallographic orientations of the plurality of experimental diffraction patterns into alignment with the reference frame to produce a plurality of rotated crystallographic orientations.

The application is suitable for the technical field of electron backscatter diffraction crystallography characterization, and provides a non-cubic crystal system EBSD three-dimensional texture high-precision visual analysis method, which comprises seven core steps of crystallography modeling, EBSD data reading and orientation extraction, ODF calculation, IPF color key preprocessing and mapping, pole figure and inverse pole figure calculation, weak texture partition identification and standardized data output; the application, through complete non-cubic crystal system symmetry modeling, reduces the triclinic crystal system orientation calculation error to less than 5 degrees; through Lambert projection coordinate explicit output and standardized data protocol, the visual closedness and format barriers of commercial software are broken; through dynamic threshold partition, the weak texture detection lower limit is reduced to 5 degrees, and the sensitivity is improved by about 80% compared with the traditional method; the application has high precision, strong compatibility and low cost, and can be widely applied to EBSD texture characterization work in the fields of material science, metallurgy, geology and the like.

This beta-digallium trioxide single crystal substrate has a circular main surface. The main surface is the (001) plane of the beta-digallium trioxide single crystal, and has a central part including the center and an outer circumferential part surrounding the central part. When pole figure measurement using an X-ray diffraction method, in which the (-201) plane of the single crystal is set as a diffraction plane, is executed in a tilt angle direction and an in-plane rotation angle direction with respect to five sections represented with prescribed coordinates in the central part, five X-ray pole figures each having at least a first pole as one pole are obtained. A first full width at maximum, which is the full width at half maximum in the tilt angle direction of a first diffraction intensity obtained through first main measurement with respect to the first pole and the periphery thereof by using the X-ray diffraction method, is 0.0028-6.0000° in each of the five X-ray pole figures. The first main measurement is executed by fixing the in-plane rotation angle to an in-plane rotation angle φ1 of the first pole, and scanning the tilt angle.

This invention provides a method and system for simultaneous neutron diffraction detection of texture and stress, comprising: Step 1: obtaining the crystal structure type of each phase and the number of pole figures and crystal planes required for neutron diffraction detection of texture; Step 2: performing neutron diffraction detection to obtain material texture information; Step 3: obtaining the texture component to be tested and the crystal plane to be tested, and calculating the specific position of the crystal plane to be tested of the texture component in the corresponding crystal plane pole figure; Step 4: obtaining the crystal plane pole figure of the detected texture, the pole figure scanning range, and the scanning step size; Step 5: acquiring neutron diffraction data; Step 6: calculating the three-dimensional internal stress field of different texture components of the material; Step 7: projecting the obtained neutron diffraction data onto the crystal plane pole figure, and using the symmetry of the crystal structure and mathematical processes to complete it into a complete crystal plane pole figure. This invention significantly reduces the workload of simultaneous texture-stress detection and improves the efficiency of simultaneous texture-stress detection.

The application provides a three-dimensional neutron diffraction data processing method and system of a single crystal material, comprising the following steps: performing rough scanning on a single crystal sample through a polar diagram mode to determine a rotation center of a single crystal sample signal; performing fine scanning at the rotation center to obtain a three-dimensional neutron diffraction signal; decomposing the three-dimensional neutron diffraction signal to obtain a diffraction peak curve and a rocking curve plane; correcting coordinates of the rocking curve plane; decomposing the corrected rocking curve plane to obtain a rocking curve; and quantitatively analyzing crystal face spacing and orientation distribution information in the three-dimensional diffraction signal according to the diffraction peak curve and the rocking curve. The application can non-destructively characterize the internal microstructure of the single crystal material, provides accurate data support for studying lattice strain distribution and orientation characteristics, and can further synchronously characterize and analyze the lattice spacing and orientation distribution information.

The present invention provides flat metal particles that are metal particles of iron-based metal, for example, the flat metal particles being excellent in magnetic characteristics or the like even in a high frequency range.　In an inverse pole figure of the flat metal particles in a direction perpendicular to a flat surface by pole evaluation using X-ray diffraction, the pole density of (111) is higher than the pole density of (001), and the pole density of (111) is 2 or more.

The metal sputtering target contains a metal having a body-centered cubic structure or a face-centered cubic structure. In the metal sputtering target, the crystal orientation is analyzed from the normal direction (ND direction) of the sputtering surface by observing a cross section perpendicular to the sputtering surface of the metal sputtering target using electron backscatter diffraction. The ratio of measurement points having a plane direction within 15 degrees from the plane direction having the highest intensity in the inverse pole figure space obtained from all the measurement points to all the measurement points is 35% by area or more; in an orientation group of 1: k DEG (0 < = k < = 90), [phi]: x DEG (0 < = x < = 90), and 2: y DEG (0 < = y < = 90) when an Euler angle () expressing the crystal orientation is used to represent a crystal orientation distribution function of the metal sputtering target, the coefficient of variation of the average value is 0.5 or less in all (x, y) combinations in which the average value of the orientation densities in the range of 0 < = k < = 90 is 1.2 or more.

The present application relates to a kind of based on partition statistics weld ultrasonic simulation modeling method, system and medium.Simulation modeling method includes: weld is divided into multiple scanning areas respectively to carry out EBSD scanning to obtain complete grain orientation data;The orientation data of different scanning areas are statistically sampled, and are constructed by pole figure contrast representative orientation library;Weld is subdivided into multiple modeling feature areas;Based on Voronoi algorithm, columnar grain geometric model is generated;Euler angle in representative orientation library is converted into elastic stiffness matrix, and corresponding Voronoi grain entity is given;In finite element software, ultrasonic testing model is established to carry out simulation.The present application combines the strategy of regional EBSD scanning strategy and the strategy of reconstructing geometric structure with Voronoi algorithm, simultaneously proposes "statistical sampling based on pole figure consistency" method, and assigns value reconstructs geometric structure, realizes the balance of simulation calculation efficiency and microstructure restoration degree.