Method for measuring inverse pole figure by inclining and rotating test sample
A technology of inverse pole figure and axis of rotation, applied in measuring devices, material analysis using wave/particle radiation, instruments, etc., can solve the problems of deviation of material properties, inverse pole figure not suitable for measuring textured samples, etc. , to achieve a good corresponding effect
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[0024] In order to better explain the present invention, the present invention will be further described in detail below in conjunction with the accompanying drawings and specific embodiments, but they do not limit the present invention.
[0025] The method of measuring the inverse pole figure by tilting and rotating the sample, such as Figure 4 shown, including the following steps:
[0026] 1) Determination of the position of each diffraction peak: adopt a symmetrical diffraction method to obtain a diffraction pattern of a sample and a standard sample, to determine the positions of several {hkl} diffraction peaks, that is, the 2θ position, and the background on the left and right sides of the diffraction peak Location;
[0027] 2) Put the sample 3 on the 1θ axis of the X-ray diffractometer measuring device, place the detector 5 on the 2θ axis, first let the 1θ axis and the 2θ axis be at the initial position of 0°;
[0028] 3) Make the 1θ axis and the 2θ axis according to t...
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