Method for measuring macroscopic texture of high-magnetic induction oriented electrical steel

Abstract

The invention relates to a method for measuring macroscopic texture of high-magnetic induction oriented electrical steel, which is applicable to detection of the high-magnetic induction oriented electrical steel with the average sample grain size of above 10mm. The method comprises the following steps: acquiring a synthetic sample and a contrast sample; measuring an incomplete pole figure of the synthetic sample and determining an orientation distribution function; obtaining the macroscopic texture of the high-magnetic induction oriented electrical steel. Through reasonable distribution of the samples and mathematical transformation, the representativeness of a result and the working efficiency can be significantly improved, so that the method can be widely applicable to the fields of production and research of the high-magnetic induction oriented electrical steel for an electrical transformer.

Description

Technical field: [0001] The invention relates to a method for measuring macroscopic texture, and more particularly relates to a method for measuring macroscopic texture of high magnetic induction oriented electrical steel. Background technique: [0002] In power systems, high-voltage large-scale power transformers generally use high-inductance oriented electrical steel laminations to make cores. The magnetic performance level of oriented electrical steel is directly related to the volume and loss of transformer cores. Determining the macroscopic texture of silicon steel sheets can be used The magnetic properties of the sample, especially the magnetic induction of the sample, can be reflected from the structural information inside the material. In oriented electrical steel as a face-centered cubic fcc metal, the common feature of {100}<001> cubic texture and {110}<001> Gaussian texture is the <001> direction which is easy to conduct magnetism, which is benef...

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Problems solved by technology

[0003] In order to find out the corresponding relationship between the magnetic induction intensity of high magnetic induction oriented electrical steel (national standard GB2521-2008 requires B8≥1.88T) and the internal structure of the material, "Material Science Principles of Electrical Steel" (Mao Weimin, Yang Ping. Material Science of Electrical Steel Principle [M]. Beijing: Higher Education Press, 2013) uses the concept of orientation degree to express, which is defined as the area of ​​grains with crystal orientation deviation angle within 3°, 5° or 7° in the sample It accounts for the percentage of the total statistic grain area, where the deviation angle refers to the average value of the inclination angle of the direction of the grain relative to the rolling surface and the deviation angle of the rolling surface relative to RD, but it is difficult to pass the three-dimensional measurement of the grain Euler angles to calculate the deviation angle

Qiu Shengtao (Chinese invention patent 201310205545.1) and others used electron backscatter diffraction (EBSD) technology to detect the misorientation of oriented silicon steel grains, and obtained the corresponding relationship between magnetic induction intensity and misorientation. The disadvantage of this method is that for the average grain size exceeding 20mm The grain-oriented electrical steel sheet is lack of statistics. The reason is that the scanning electron microscope (SEM) equipped with EBSD probe has strict restrictions on the size of the tested sample. According to its patent requirements, it includes at least 15 grains. At this time, the length of the sample reaches more than 300mm. EBSD scatter point grain orientation measurements are clearly not possible

Li Changyi (Chinese Invention Patent 201310576260.9) and others combined the samples along the rolling direction, and used the formula G=P 001 / ∑P uvw Indicates the degree of orientation of the sample. The disadvantage of this method is that the processing of the narrow sample used is relatively difficult, and at the same time, the reliability of the measurement results or the measurement error cannot be given.

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