29 results about "Misorientation" patented technology

The present invention proposes a method for predicting the high-temperature creep life of nickel-based single crystals under the influence of orientation deviation, which relates to the field of reliability technology. The method comprises: establishing a three-dimensional finite element round rod model based on the dimensions of a nickel-based single crystal creep specimen; establishing a constitutive equation for the nickel-based single crystal based on crystal plasticity theory, wherein the constitutive equation for the nickel-based single crystal includes a deformation equation that considers orientation deviation and a damage equation that considers orientation deviation; combining the three-dimensional finite element round rod model and the nickel-based single crystal constitutive equation to perform creep finite element simulation calculations on the round rod model; and establishing a creep time-strain curve and predicting the creep life based on the results of the creep finite element simulation calculations. The present invention can relatively accurately evaluate and predict the high-temperature creep life of nickel-based single crystal turbine blades used in actual industrial manufacturing.

To provide an aluminum alloy foil.SOLUTION: This aluminum alloy foil comprises an aluminum alloy having a composition of Fe: 0.8 mass% mor more to 2.0 mass% or less, Si: 0.2 mass% or less, with the balance being Al and inevitable impurities; having an elongation of 10% or more in a 0° direction with respect to the rolling direction, an elongation of 15% or more in a 45° direction with respect to the rolling direction, and an elongation of 10% or more in a 90° direction with respect to the rolling direction; having an average crystal grain size of 3.5 μm or less of crystal grains surrounded by a misorientation of 5° or more on the surface; and, on the surface, satisfying the following formula (1) for the ratio of crystal grain boundary lengths obtained by performing crystal orientation analysis by an EBSD method in the same field of view. Formula (1): crystal grain boundary length of crystal grains having a misorientation of 2° or more and less than 15° / crystal grain boundary length of crystal grains having a misorientation of 15° or more>0.5.SELECTED DRAWING: Figure 1

To provide a steel sheet having high strength and excellent toughness, and a method for producing the same.SOLUTION: The steel sheet has the chemical composition described in the specification, where Ceq is 0.25-0.60%, and BF' is more than 0%. In a C cross section, the metal structure at a position of 1 / 4t includes bainite in an amount of 70% or more in terms of area%, and an average grain size of bainitic ferrite constituting the bainite is 10 μm or less. Among the bainitic ferrite grains, a proportion of bainitic ferrite grains having an intragranular orientation difference of less than 5° is 1% or more and less than 30% in terms of area%. An average grain size of parent phase austenite obtained by inverse analysis from crystal orientation information of a matrix structure is 80 μm or less. A number density of B-containing precipitates having a grain size of 1 μm or more present on crystal grain boundaries of the parent phase austenite is 30 particles / mm or less.SELECTED DRAWING: None

The invention relates to a method for measuring dendritic crystal orientation deviation of a single crystal blade through monochromatic neutron diffraction imaging, which accurately captures crystal structure information through neutron diffraction, can clearly obtain diffraction signals of different areas of the single crystal blade, and can accurately measure the orientation deviation of defective crystal grains through the steps of defect position determination, bright spot matching and the like. By utilizing the deep penetrability and volatility of neutrons, the interior of the blade can be detected under the condition that the single crystal blade is not damaged. Meanwhile, the neutron imaging detection range is larger than that of a traditional X-ray method, overall imaging of the single crystal blade can be achieved, operation such as data cutting and splicing is not needed, the result is more visual and accurate, and consumed time is shorter.

The present disclosure relates to a method of manufacturing a diamond substrate that comprises a {111}-plane surface. The method comprises: - fabricating a plurality of mesa structures on a main diamond substrate, wherein the main diamond substrate comprises a first surface that has a planar orientation that has a misorientation angle relative to the {111} surface; - growing diamond on the first surface of the main diamond substrate by applying a vapor-phase synthesis method on at least the first surface of the main diamond substrate; - cutting the main diamond substrate along the {111} plane such that a distance between the first surface and a second surface that is arranged opposite of the first surface is reduced; and - removing material from the second surface until the main diamond substrate is separated in a plurality of diamond substrates that correspond to the plurality of mesa structures.

The invention discloses a method for accurately measuring crystal axis orientation of gallium oxide single crystal, and relates to the technical field of material science, and the method comprises the following steps: collecting acoustic original data of the gallium oxide single crystal through a quantum entanglement sensor network; carrying out compression reconstruction processing on the acoustic original data, constructing a sound velocity anisotropy tensor, and generating a lattice vibration characteristic spectrum; constructing an enzymatic reaction kinetic model according to the lattice vibration characteristic spectrum, defining an enzymatic differential equation, and calculating a steady-state crystal orientation angle concentration value; mapping the steady-state crystal orientation angle concentration value to a wafer space coordinate, establishing a steady-state crystal orientation angle concentration field distribution matrix by solving a diffusion equation, and converting the steady-state crystal orientation angle concentration field distribution matrix into a crystal axis orientation deviation thermodynamic diagram; through the superconducting sensor network in the quantum entangled state, the spatial resolution and the time resolution are improved, and the dependency of an existing physical characterization method on the flatness and cleanliness of the surface of a sample is overcome.

An example method includes measuring, by at least one of a polarized light device, a spatially resolved acoustic spectroscopy device, or an eddy current device, an alpha phase data set indicative of an alpha phase of a crystalline structure of a material. The method includes receiving, by processing circuitry, the alpha phase data set, wherein the alpha phase data set comprises a plurality of pixels, wherein each pixel of the plurality of pixels includes a position, a first Euler angle, a second Euler angle, and a third Euler angle, wherein the third Euler angle is missing or erroneous. The method also includes adjusting, by the processing circuitry, the third Euler angle of a pixel of the plurality of pixels and storing, by the processing circuitry and based on adjusting the third Euler angle of the pixel reducing a total beta phase misorientation, the alpha phase data set.

Proposed are a thin film having an excellent crystal orientation property, a method of manufacturing the same, and a semiconductor device, a battery device, a superconducting wire, and a superconducting article including the thin film. The technical gist of the present disclosure includes a thin film having a single-crystal-level crystal orientation property, which is formed by depositing a polycrystalline second material on an upper portion of a substrate including a polycrystalline first material and which has a crystal orientation property satisfying the following Relational Expression 1 at a grain boundary, a method of manufacturing the same, and a semiconductor device, a battery device, a superconducting wire, and a superconducting article including the thin film.0°<FWHM2≤3°  [Relational Expression 1](FWHM2 is a full width at half maximum of a distribution curve of a misorientation angle at the grain boundary of the thin film).

The invention relates to the technical field of coated cutters, and provides a grain boundary reinforced alpha-Al2O3 coating cutting tool and a preparation method thereof, the cutting tool comprises a matrix and a coating on the surface of the matrix; the coating at least comprises an alpha-Al2O3 coating deposited through a CVD method, the depth of the alpha-Al2O3 coating is analyzed to be smaller than 60% of the thickness through an electron back scattering device, the alpha-Al2O3 coating is parallel to the polished section of the surface of the coating, in an orientation difference angle distribution diagram, the highest peak appears within the orientation difference angle range of 60 + / -8.7 degrees of adjacent crystal grains, and the proportion is larger than 0.3. The cutting tool with the grain boundary reinforced alpha-Al2O3 coating shows excellent wear resistance and collapse resistance in turning of steel parts.

According to the wafer expanding ring structure capable of easily and rapidly identifying the assembly error direction, the first positioning identifier and the second positioning identifier which are opposite, and the first orientation identifier and the second orientation identifier are arranged on the outer ring and the inner ring, so that an assembler at a production end is helped to rapidly judge and confirm the assembly direction, the assembly error is avoided, and the production efficiency is improved. And the wrong direction judgment efficiency and the assembly efficiency and accuracy of the client can be improved at the same time.

To provide a steel plate capable of achieving superior Charpy toughness in a HAZ produced by high heat-input welding, together with superior strength at a 1 / 2 thickness position of a base material and superior Charpy toughness after strain aging treatment, and to provide a method for producing the steel plate.SOLUTION: A steel plate has a component composition containing predetermined amounts of C, Si, Mn, P, S, Al, Ti, N, and O, with Ceq being 0.300-0.500%, Ti / N being 2.00-5.00, and the balance being Fe and inevitable impurities, and has, at a 1 / 2 thickness position, a steel microstructure in which ferrite+bainite phases account for 80% or more in area ratio, an average grain size of ferrite and bainite phases surrounded by grain boundaries having an orientation difference of 15° or more is 30 μm or less, and an area ratio of MA in the bainite phase is 15% or less.SELECTED DRAWING: None

A metallic structure, a method of preparing the metallic structure, and the electronic device including the metallic structure. The metallic structure includes a ruthenium (Ru) thin film disposed on an insulation film or a contact metal, where the ruthenium thin film has a crystal structure including grains having a (001) orientation, neighboring grains among the grains in the thin film have a misorientation angle of less than or equal to about 15° at a grain boundary based on a horizontal direction of the thin film.

The steel sheet is characterized by having a metal structure having a predetermined chemical composition, containing, by area ratio, 70 to 95% bainite and 3 to 20% martensite, the total of bainite and martensite being 90% or more, the average misorientation within crystal grains surrounded by grain boundaries with a crystal misorientation of 15° or more being 0.60° or less, and the proportion of crystal grains containing two or more martensite grains within the grains being 90% or more.

To provide a copper plate suitable for laser processing and laser welding, by sufficiently improving a light absorption rate of a wavelength in an infrared region.SOLUTION: A Cu content is 99 mass% or more, the surface roughness Sdq (root mean square slope) is within the range of 0.05 to 0.50, and the surface roughness Sdr (developed interfacial area ratio) is within the range of 0.15% to 5.00%. In a cross-section perpendicular to the rolling width direction, the crystal grain size is 100 μm or less. The grain boundaries are classified as follows: those with an orientation difference of 2° to 15° between adjacent grains are low-angle grain boundaries; special grain boundaries (Σ3, 9, 27); and those with an orientation difference exceeding 15°(excluding special grain boundaries) are high-angle grain boundaries. The lengths of the low-angle grain boundaries (X), special grain boundaries (Y), and high-angle grain boundaries (Z) satisfy the condition (X+Z) / (X+Y+Z)>30%.SELECTED DRAWING: None

To provide a support substrate, an electronic device, and a module which are applied to a frequency band of 3.5 GHz or more for effectively reducing the energy of longitudinal wave transmission, effectively reducing spurious reflection, and realizing normal filtering.SOLUTION: In the polycrystalline material which is the material of the support substrate of the present invention, the number of small-angle grain boundaries having a misorientation angle of 2 to 15 ° in the support substrate accounts for 1 to 5% of the total number of grain boundaries. Accordingly, the support substrate having the specific occupancy of the small-angle grain boundaries is able to effectively reduce or prevent spurious responses to ensure normal filtering.SELECTED DRAWING: None

Method for measuring crystal disorientation of a monocrystalline blade Method for measuring crystal disorientation of a monocrystalline blade (10) comprising a material formed of dendrites (30) having a main trunk (32) extending in a main direction (Z') and branches (34), the method comprising defining a reference frame (XYZ) of the blade comprising a radial direction (Z), mechanically and chemically treating the blade (10) in a base plane (P1) to acquire a first image (I1) by micrography, mechanically and chemically treating the blade (10) in a comparison plane (P2) radially offset from the base plane (P1) by a distance (D), to acquire a second image (I2) by micrography, processing the first and second images (I1, I2) so as to compare the position of the main trunk (32) of each dendrite (30) between the two images (I1,I2) and thus deduce the orientation of the main direction (Z') of the dendrites (30) with respect to the radial direction (Z). Figure for the abstract: Fig. 4.,

To provide a steel sheet having high strength and excellent toughness, and a method for producing the same.SOLUTION: The steel sheet has the chemical composition described in the specification, where Ceq is 0.25-0.60%, and BF' is more than 0%. In a C cross section, the metal structure at a position of 1 / 4t includes bainite in an amount of 70% or more in terms of area%, and an average grain size of bainitic ferrite constituting the bainite is 10 μm or less. Among the bainitic ferrite grains, a proportion of bainitic ferrite grains having an intragranular orientation difference of less than 5° is 1% or more and less than 30% in terms of area%. An average grain size of parent phase austenite obtained by inverse analysis from crystal orientation information of a matrix structure is 80 μm or less. A number density of B-containing precipitates having a grain size of 1 μm or more present on crystal grain boundaries of the parent phase austenite is 30 particles / mm or less.SELECTED DRAWING: None

A magnetic wire made of an alloy containing iron and cobalt as main components, wherein the magnetic wire has a structure including at least an α phase of the α phase and a γ phase, the structure has a high angle grain boundary having a misorientation of 15° or more, the proportion of the area of the α phase relative to the total area of the α phase and the γ phase in a cross section of the magnetic wire is 90% or more, the average crystal grain size of the α phase in the cross section is 2.5 μm or less, and the proportion of the length of the high angle grain boundary relative to the total length of grain boundaries in the structure in the cross section is 60% or more.

A support substrate, a composite substrate, an electronic device, and a module are provided, the support substrate is made of a polycrystalline material, a number of small-angle grain boundary with a misorientation angle of 2° to 15° in the support substrate accounts for 1% to 5% of a total number of grain boundaries, and the support substrate with the specific small-angle grain boundary proportion can effectively suppress spurious signals and ensure normal filtering.

This hot-rolled steel sheet has a predetermined chemical composition, in which a metallographic structure contains, by area %, less than 3.0% of residual austenite, 15.0% or more and less than 60.0% of ferrite, and less than 5.0% of pearlite, has a ratio L60 / L7 of a length L60 of a grain boundary having a crystal misorientation of 60° to a length L7 of a grain boundary having a crystal misorientation of 7° about a <110> direction of 0.60 or more, has a standard deviation of a Mn concentration of 0.60 mass % or less, and has a tensile strength of 980 MPa or more.

A method for implementing a photovoltaic device comprising: - measuring a misorientation angle θmes of a given lateral face (41d) of a rectangular or square crystalline silicon wafer with respect to a crystalline orientation '(110)', - forming conductive tracks (55, 57, 59) on the upper face, oriented to achieve a given angle α with respect to at least one first lateral face (41e) among said lateral faces, determined according to said measured misorientation angle θmes, then - performing a cleaving step to separate said wafer (40) into a first portion and a second portion. Figure for the abstract: 6.

This hot-rolled steel sheet has a predetermined chemical composition, in which a metallographic structure contains, by area %, more than 92.0% and 100.0% or less of martensite and tempered martensite in total, less than 3.0% of residual austenite, and less than 5.0% of ferrite, has a ratio S60 / S7, which is a ratio of a density S60 of a length of a grain boundary having a crystal misorientation of 60° to a density S7 of a length of a grain boundary having a crystal misorientation of 7° about a <110> direction, of more than 0.34 and less than 0.60, has a standard deviation of a Mn concentration of 0.60 mass % or less, and has a tensile strength of 980 MPa or more.

The present invention relates to a method for measuring the crystal orientation difference of a single-crystal blade (10), the blade (10) comprising a material formed of dendrites (30) having a trunk (32) and branches (34) extending in a principal direction (Z'), the method comprising: defining a reference coordinate system (XYZ) for the blade, the reference coordinate system including a radial direction (Z); mechanically and chemically treating the blade (10) in a base plane (P1) to acquire a first image (I1) by photomicrography; mechanically and chemically treating the blade (10) in a comparison plane (P2) offset radially from the base plane (P1) by a distance (D) to acquire a second image (I2) by photomicrography; and processing the first and second images (I1, I2) to compare the position of the trunk (32) of each dendrite (30) in the two images (I1, I2) and thereby derive the orientation of the principal direction (Z') of the dendrite (30) relative to the radial direction (Z).

An example method includes measuring, by at least one of a polarized light device, a spatially resolved acoustic spectroscopy device, or an eddy current device, an alpha phase data set indicative of an alpha phase of a crystalline structure of a material. The method includes receiving, by processing circuitry, the alpha phase data set, wherein the alpha phase data set comprises a plurality of pixels, wherein each pixel of the plurality of pixels includes a position, a first Euler angle, a second Euler angle, and a third Euler angle, wherein the third Euler angle is missing or erroneous. The method also includes adjusting, by the processing circuitry, the third Euler angle of a pixel of the plurality of pixels and storing, by the processing circuitry and based on adjusting the third Euler angle of the pixel reducing a total beta phase misorientation, the alpha phase data set.

Provided is a steel sheet characterized by having a predetermined chemical composition and a metallographic structure, wherein, in terms of area fraction, the structure comprises 70% to 95% of bainite and 3% to 20% of martensite, the sum of bainite and martensite is 90% or above, the average intragranular misorientation of crystal grains surrounded by grain boundaries with a crystal orientation difference of 15° or above is 0.60° or below, and the proportion of crystal grains containing two or more martensite grains therein is 90% or above.

The invention belongs to the field of rare earth permanent magnet materials, and particularly relates to a method for evaluating the orientation degree of a sintered neodymium-iron-boron magnet. The method comprises the following steps: carrying out electron backscatter diffraction (EBSD) analysis on the neodymium iron boron magnet, and carrying out electron backscatter diffraction (EBSD) analysis on the neodymium iron boron magnet; euler angle data obtained by the EBSD test are converted into an included angle theta i between a crystal grain c axis and an orientation field direction through mathematical transformation; the method comprises the following steps: carrying out automatic segmentation on an EBSD image by utilizing an image segmentation large model (SAM) to obtain a high-precision segmentation mask of each crystal grain; traversing the acquisition points in the mask of each crystal grain to obtain a staggered orientation angle of each crystal grain; and carrying out statistics on error orientation angles of all crystal grains, drawing a frequency distribution histogram and a cumulative distribution histogram of the error orientation angles, and outputting an orientation degree analysis report. The method for evaluating the orientation degree of the sintered neodymium-iron-boron magnet is established by combining EBSD and SAM image segmentation technologies, and the method has the advantages of high accuracy and high efficiency at the same time.

The invention relates to a method for preparing a composite structure comprising the following steps: 1) providing a composite structure comprising a monocrystalline silicon carbide growth layer, a free face of which extends along a main plane and arranged on a support substrate, the growth layer being delimited by a peripheral periphery and having a crystallographic orientation such that there exists: - a misorientation angle between a given crystallographic plane and the free face, - a misorientation direction, projection of an axis normal to the free face, onto the crystallographic plane, and - a reference direction, projection of the misorientation direction onto the main plane;2) the formation of a trench in the growth layer, the trench having an inner border which extends at a distance and continuously along the peripheral periphery, following a contour such that, by defining four cardinal points (North-South-West-East) on the peripheral periphery, with the West-East direction corresponding to the reference direction: - the contour passing through the cardinal points North-West-South follows a general shape of the peripheral periphery, - the contour passing through the cardinal points North-East-South is saw-toothed. The invention also relates to a composite structure capable of being produced by the aforementioned preparation method. Figure to be published with the abstract: no figure;

The present application relates to a method for growing a misoriented silicon carbide single crystal by a liquid phase method, and belongs to the technical field of silicon carbide single crystal production. The method is performed by using a device for growing a silicon carbide single crystal by a liquid phase method, the device comprising a wedge-shaped seed crystal holder and a wedge-shaped seed crystal. The method comprises: arranging the wedge-shaped seed crystal on the wedge-shaped seed crystal holder to form a normal-oriented seed crystal surface, and then growing silicon carbide on the normal-oriented seed crystal surface by a liquid phase method to obtain a crystal ingot comprising the wedge-shaped seed crystal and a grown silicon carbide crystal; and taking the crystal ingot off the wedge-shaped seed crystal holder, and performing multi-wire slicing based on the inclined surface of the wedge-shaped seed crystal to obtain a misoriented silicon carbide single crystal. The method of the present application forms a normal-oriented seed crystal surface by using the wedge-shaped seed crystal and the wedge-shaped seed crystal holder for liquid phase growth, and then obtains a misoriented silicon carbide single crystal by multi-wire slicing. The method of the present application does not require a crystal orientation step, can reduce the process of misoriented single-wire slicing or flat grinding, saves processing time, and can recycle the new wedge-shaped seed crystal.

An electric resistance welded steel pipe includes a base metal zone and an electric resistance welded zone. The base metal zone has a predetermined chemical composition and a microstructure including, by volume, ferrite: more than 30%, and bainite: 10% or more. The total volume fraction of the ferrite and the bainite is 70% or more and 95% or less. The balance being one or two or more phases selected from pearlite, martensite, and austenite. Further, when regions surrounded by boundaries between adjacent crystals having a misorientation of 15° or more are defined as crystal grains, the average size of the crystal grains is less than 7.0 μm, and the volume fraction of crystal grains having a size of 40.0 μm or more is 30% or less. A compressive residual stress generated in the inner and outer surfaces of the steel pipe in the axial direction is 250 MPa or less.