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38 results about "Misorientation" patented technology

Misorientation is the difference in crystallographic orientation between two crystallites in a polycrystalline material. In crystalline materials, the orientation of a crystallite is defined by a transformation from a sample reference frame (i.e. defined by the direction of a rolling or extrusion process and two orthogonal directions) to the local reference frame of the crystalline lattice, as defined by the basis of the unit cell.

Prediction method of high temperature creep life of nickel-based single crystal under the influence of orientation deviation

The present invention proposes a method for predicting the high-temperature creep life of nickel-based single crystals under the influence of orientation deviation, which relates to the field of reliability technology. The method comprises: establishing a three-dimensional finite element round rod model based on the dimensions of a nickel-based single crystal creep specimen; establishing a constitutive equation for the nickel-based single crystal based on crystal plasticity theory, wherein the constitutive equation for the nickel-based single crystal includes a deformation equation that considers orientation deviation and a damage equation that considers orientation deviation; combining the three-dimensional finite element round rod model and the nickel-based single crystal constitutive equation to perform creep finite element simulation calculations on the round rod model; and establishing a creep time-strain curve and predicting the creep life based on the results of the creep finite element simulation calculations. The present invention can relatively accurately evaluate and predict the high-temperature creep life of nickel-based single crystal turbine blades used in actual industrial manufacturing.
Owner:YANSHAN UNIV

Aluminum alloy foil and method for producing same

PendingJP2025166259ACrystal orientationMisorientation
To provide an aluminum alloy foil.SOLUTION: This aluminum alloy foil comprises an aluminum alloy having a composition of Fe: 0.8 mass% mor more to 2.0 mass% or less, Si: 0.2 mass% or less, with the balance being Al and inevitable impurities; having an elongation of 10% or more in a 0° direction with respect to the rolling direction, an elongation of 15% or more in a 45° direction with respect to the rolling direction, and an elongation of 10% or more in a 90° direction with respect to the rolling direction; having an average crystal grain size of 3.5 μm or less of crystal grains surrounded by a misorientation of 5° or more on the surface; and, on the surface, satisfying the following formula (1) for the ratio of crystal grain boundary lengths obtained by performing crystal orientation analysis by an EBSD method in the same field of view. Formula (1): crystal grain boundary length of crystal grains having a misorientation of 2° or more and less than 15° / crystal grain boundary length of crystal grains having a misorientation of 15° or more>0.5.SELECTED DRAWING: Figure 1
Owner:MA ALUMINUM CORP

Steel sheet and method for producing the same

To provide a steel sheet having high strength and excellent toughness, and a method for producing the same.SOLUTION: The steel sheet has the chemical composition described in the specification, where Ceq is 0.25-0.60%, and BF' is more than 0%. In a C cross section, the metal structure at a position of 1 / 4t includes bainite in an amount of 70% or more in terms of area%, and an average grain size of bainitic ferrite constituting the bainite is 10 μm or less. Among the bainitic ferrite grains, a proportion of bainitic ferrite grains having an intragranular orientation difference of less than 5° is 1% or more and less than 30% in terms of area%. An average grain size of parent phase austenite obtained by inverse analysis from crystal orientation information of a matrix structure is 80 μm or less. A number density of B-containing precipitates having a grain size of 1 μm or more present on crystal grain boundaries of the parent phase austenite is 30 particles / mm or less.SELECTED DRAWING: None
Owner:NIPPON STEEL CORPORATION

Method for measuring dendritic crystal orientation deviation of single crystal blade through monochromatic neutron diffraction imaging

The invention relates to a method for measuring dendritic crystal orientation deviation of a single crystal blade through monochromatic neutron diffraction imaging, which accurately captures crystal structure information through neutron diffraction, can clearly obtain diffraction signals of different areas of the single crystal blade, and can accurately measure the orientation deviation of defective crystal grains through the steps of defect position determination, bright spot matching and the like. By utilizing the deep penetrability and volatility of neutrons, the interior of the blade can be detected under the condition that the single crystal blade is not damaged. Meanwhile, the neutron imaging detection range is larger than that of a traditional X-ray method, overall imaging of the single crystal blade can be achieved, operation such as data cutting and splicing is not needed, the result is more visual and accurate, and consumed time is shorter.
Owner:CHINA INSTITUTE OF ATOMIC ENERGY

Hot-rolled steel sheet

This hot-rolled steel sheet has a predetermined chemical composition, in which a microstructure contains, by area %, less than 3.0% of residual austenite, 15.0% or more and less than 60.0% of ferrite, and less than 5.0% of pearlite, has a ratio L60 / L7 of a length L60 of a grain boundary having a crystal misorientation of 60° to a length L7 of a grain boundary having a crystal misorientation of 7° about a <110> direction of less than 0.60, has a standard deviation of a Mn concentration of 0.60 mass % or less, and has a tensile strength of 980 MPa or more.
Owner:NIPPON STEEL CORPORATION

Method of manufacturing a diamond substrate

The present disclosure relates to a method of manufacturing a diamond substrate that comprises a {111}-plane surface. The method comprises: - fabricating a plurality of mesa structures on a main diamond substrate, wherein the main diamond substrate comprises a first surface that has a planar orientation that has a misorientation angle relative to the {111} surface; - growing diamond on the first surface of the main diamond substrate by applying a vapor-phase synthesis method on at least the first surface of the main diamond substrate; - cutting the main diamond substrate along the {111} plane such that a distance between the first surface and a second surface that is arranged opposite of the first surface is reduced; and - removing material from the second surface until the main diamond substrate is separated in a plurality of diamond substrates that correspond to the plurality of mesa structures.
Owner:TECH UNIV DELFT

Method for accurately measuring crystal axis orientation of gallium oxide single crystal

The invention discloses a method for accurately measuring crystal axis orientation of gallium oxide single crystal, and relates to the technical field of material science, and the method comprises the following steps: collecting acoustic original data of the gallium oxide single crystal through a quantum entanglement sensor network; carrying out compression reconstruction processing on the acoustic original data, constructing a sound velocity anisotropy tensor, and generating a lattice vibration characteristic spectrum; constructing an enzymatic reaction kinetic model according to the lattice vibration characteristic spectrum, defining an enzymatic differential equation, and calculating a steady-state crystal orientation angle concentration value; mapping the steady-state crystal orientation angle concentration value to a wafer space coordinate, establishing a steady-state crystal orientation angle concentration field distribution matrix by solving a diffusion equation, and converting the steady-state crystal orientation angle concentration field distribution matrix into a crystal axis orientation deviation thermodynamic diagram; through the superconducting sensor network in the quantum entangled state, the spatial resolution and the time resolution are improved, and the dependency of an existing physical characterization method on the flatness and cleanliness of the surface of a sample is overcome.
Owner:SHENZHEN XINHONGTU TECH CO LTD

Measurement and determination of crystallographic texture with respect to position

An example method includes measuring, by at least one of a polarized light device, a spatially resolved acoustic spectroscopy device, or an eddy current device, an alpha phase data set indicative of an alpha phase of a crystalline structure of a material. The method includes receiving, by processing circuitry, the alpha phase data set, wherein the alpha phase data set comprises a plurality of pixels, wherein each pixel of the plurality of pixels includes a position, a first Euler angle, a second Euler angle, and a third Euler angle, wherein the third Euler angle is missing or erroneous. The method also includes adjusting, by the processing circuitry, the third Euler angle of a pixel of the plurality of pixels and storing, by the processing circuitry and based on adjusting the third Euler angle of the pixel reducing a total beta phase misorientation, the alpha phase data set.
Owner:ROLLS ROYCE CORP

Thin film having single-crystal-level crystal orientation property, method for manufacturing same, and product using same

Proposed are a thin film having an excellent crystal orientation property, a method of manufacturing the same, and a semiconductor device, a battery device, a superconducting wire, and a superconducting article including the thin film. The technical gist of the present disclosure includes a thin film having a single-crystal-level crystal orientation property, which is formed by depositing a polycrystalline second material on an upper portion of a substrate including a polycrystalline first material and which has a crystal orientation property satisfying the following Relational Expression 1 at a grain boundary, a method of manufacturing the same, and a semiconductor device, a battery device, a superconducting wire, and a superconducting article including the thin film.0°<FWHM2≤3°  [Relational Expression 1](FWHM2 is a full width at half maximum of a distribution curve of a misorientation angle at the grain boundary of the thin film).
Owner:KOREA ELECTROTECH RES INST

Grain boundary reinforced alpha-Al2O3 coating cutting tool and preparation method thereof

The invention relates to the technical field of coated cutters, and provides a grain boundary reinforced alpha-Al2O3 coating cutting tool and a preparation method thereof, the cutting tool comprises a matrix and a coating on the surface of the matrix; the coating at least comprises an alpha-Al2O3 coating deposited through a CVD method, the depth of the alpha-Al2O3 coating is analyzed to be smaller than 60% of the thickness through an electron back scattering device, the alpha-Al2O3 coating is parallel to the polished section of the surface of the coating, in an orientation difference angle distribution diagram, the highest peak appears within the orientation difference angle range of 60 + / -8.7 degrees of adjacent crystal grains, and the proportion is larger than 0.3. The cutting tool with the grain boundary reinforced alpha-Al2O3 coating shows excellent wear resistance and collapse resistance in turning of steel parts.
Owner:GANZHOU ACHTECK TOOL TECH

Wafer expanding ring structure capable of easily and quickly identifying assembly error direction

According to the wafer expanding ring structure capable of easily and rapidly identifying the assembly error direction, the first positioning identifier and the second positioning identifier which are opposite, and the first orientation identifier and the second orientation identifier are arranged on the outer ring and the inner ring, so that an assembler at a production end is helped to rapidly judge and confirm the assembly direction, the assembly error is avoided, and the production efficiency is improved. And the wrong direction judgment efficiency and the assembly efficiency and accuracy of the client can be improved at the same time.
Owner:XIAMEN XIANGHE RISHENG TECH CO LTD

Positive electrode active material for lithium ion secondary battery and lithium ion secondary battery

A positive electrode active material for a lithium ion secondary battery, including a lithium-nickel composite oxide having a hexagonal layered structure and configured by particles including at least either single primary particles or secondary particles with a plurality of aggregated primary particles, wherein the particles included in the positive electrode active material have a cross section having one or more crystal faces, and the one or more crystal faces in the particles have an average misorientation of 0.7° or less from a reference orientation of each of the one or more crystal faces.
Owner:SUMITOMO METAL MINING CO LTD

Steel plate and method for producing the same

To provide a steel plate capable of achieving superior Charpy toughness in a HAZ produced by high heat-input welding, together with superior strength at a 1 / 2 thickness position of a base material and superior Charpy toughness after strain aging treatment, and to provide a method for producing the steel plate.SOLUTION: A steel plate has a component composition containing predetermined amounts of C, Si, Mn, P, S, Al, Ti, N, and O, with Ceq being 0.300-0.500%, Ti / N being 2.00-5.00, and the balance being Fe and inevitable impurities, and has, at a 1 / 2 thickness position, a steel microstructure in which ferrite+bainite phases account for 80% or more in area ratio, an average grain size of ferrite and bainite phases surrounded by grain boundaries having an orientation difference of 15° or more is 30 μm or less, and an area ratio of MA in the bainite phase is 15% or less.SELECTED DRAWING: None
Owner:JFE STEEL CORP

Characterization and determination method for small misorientation grain boundaries of single crystal superalloys

The present invention relates to a method for characterizing and determining small misorientation grain boundaries of a single crystal superalloy. The method includes: preparing a wedge-shaped sample of the single crystal superalloy; observing the equal-thickness fringes on both sides of the small misorientation grain boundary in the wedge-shaped sample under a transmission electron microscope, and the position where the equal-thickness fringes are broken and misaligned is determined as the position of the grain boundary. The method of the present invention utilizes the principle of equal-thickness fringes generated by Bragg extinction of the transmission electron microscope to judge whether the single crystal superalloy contains small misorientation grain boundary defects at the nanoscale, effectively solving the problems of too large observation scale and poor resolution in the traditional method, and providing a new determination method for small misorientation grain boundaries of single crystal superalloys.
Owner:TSINGHUA UNIVERSITY

Metallic Structure, Method of Preparing Same, and Electronic Device Including Same

A metallic structure, a method of preparing the metallic structure, and the electronic device including the metallic structure. The metallic structure includes a ruthenium (Ru) thin film disposed on an insulation film or a contact metal, where the ruthenium thin film has a crystal structure including grains having a (001) orientation, neighboring grains among the grains in the thin film have a misorientation angle of less than or equal to about 15° at a grain boundary based on a horizontal direction of the thin film.
Owner:SAMSUNG ELECTRONICS CO LTD

Steel plates and outer panel components

The steel sheet is characterized by having a metal structure having a predetermined chemical composition, containing, by area ratio, 70 to 95% bainite and 3 to 20% martensite, the total of bainite and martensite being 90% or more, the average misorientation within crystal grains surrounded by grain boundaries with a crystal misorientation of 15° or more being 0.60° or less, and the proportion of crystal grains containing two or more martensite grains within the grains being 90% or more.
Owner:NIPPON STEEL CORPORATION

Substrate having single crystalline thin film formed thereon and single crystalline laminated structure comprising same

The present invention relates to a substrate on which a single crystalline thin film is formed, and a single crystalline laminated structure comprising same and, specifically, to a substrate on which a single crystalline thin film oriented in the (111) plane is formed, and a single crystalline laminated structure comprising same, the substrate comprising: a substrate formed of a polycrystalline metal or polymer; a single crystalline first thin film which is formed by depositing a polycrystalline first metal on the top of the substrate, has a crystal orientation at grain boundaries satisfying relational expression 1 below, and has a top surface oriented in the (001) plane; a single crystalline second thin film which is formed by depositing a second metal on the top of the single crystalline thin film and has a top surface oriented in the (001) plane; a single crystalline third thin film which is formed of an oxide of the second metal by oxidizing the second thin film and has a top surface oriented in the (111) plane; and a single crystalline fourth thin film which is formed by depositing a third metal on the top of the third thin film and has a top surface oriented in the (111) plane. [Relational expression 1] 0° < FWHM2 ≤ 3° (where, FWHM2 denotes a full width at half maximum of a misorientation angle distribution curve at grain boundaries of the thin film.)
Owner:KOREA ELECTROTECH RES INST

Copper plate and conjugate

PendingJP2025147366AAbsorptanceLaser processing
To provide a copper plate suitable for laser processing and laser welding, by sufficiently improving a light absorption rate of a wavelength in an infrared region.SOLUTION: A Cu content is 99 mass% or more, the surface roughness Sdq (root mean square slope) is within the range of 0.05 to 0.50, and the surface roughness Sdr (developed interfacial area ratio) is within the range of 0.15% to 5.00%. In a cross-section perpendicular to the rolling width direction, the crystal grain size is 100 μm or less. The grain boundaries are classified as follows: those with an orientation difference of 2° to 15° between adjacent grains are low-angle grain boundaries; special grain boundaries (Σ3, 9, 27); and those with an orientation difference exceeding 15°(excluding special grain boundaries) are high-angle grain boundaries. The lengths of the low-angle grain boundaries (X), special grain boundaries (Y), and high-angle grain boundaries (Z) satisfy the condition (X+Z) / (X+Y+Z)>30%.SELECTED DRAWING: None
Owner:MITSUBISHI MATERIALS CORP

Support substrate, electronic device, and module

To provide a support substrate, an electronic device, and a module which are applied to a frequency band of 3.5 GHz or more for effectively reducing the energy of longitudinal wave transmission, effectively reducing spurious reflection, and realizing normal filtering.SOLUTION: In the polycrystalline material which is the material of the support substrate of the present invention, the number of small-angle grain boundaries having a misorientation angle of 2 to 15 ° in the support substrate accounts for 1 to 5% of the total number of grain boundaries. Accordingly, the support substrate having the specific occupancy of the small-angle grain boundaries is able to effectively reduce or prevent spurious responses to ensure normal filtering.SELECTED DRAWING: None
Owner:QUANZHOU SANAN INTEGRATED CIRCUIT CO LTD

Method for measuring crystal misorientation of a single-crystal blade

Method for measuring crystal disorientation of a monocrystalline blade Method for measuring crystal disorientation of a monocrystalline blade (10) comprising a material formed of dendrites (30) having a main trunk (32) extending in a main direction (Z') and branches (34), the method comprising defining a reference frame (XYZ) of the blade comprising a radial direction (Z), mechanically and chemically treating the blade (10) in a base plane (P1) to acquire a first image (I1) by micrography, mechanically and chemically treating the blade (10) in a comparison plane (P2) radially offset from the base plane (P1) by a distance (D), to acquire a second image (I2) by micrography, processing the first and second images (I1, I2) so as to compare the position of the main trunk (32) of each dendrite (30) between the two images (I1,I2) and thus deduce the orientation of the main direction (Z') of the dendrites (30) with respect to the radial direction (Z). Figure for the abstract: Fig. 4.,
Owner:SAFRAN HELICOPTER ENGINES

Steel sheet and method for producing the same

To provide a steel sheet having high strength and excellent toughness, and a method for producing the same.SOLUTION: The steel sheet has the chemical composition described in the specification, where Ceq is 0.25-0.60%, and BF' is more than 0%. In a C cross section, the metal structure at a position of 1 / 4t includes bainite in an amount of 70% or more in terms of area%, and an average grain size of bainitic ferrite constituting the bainite is 10 μm or less. Among the bainitic ferrite grains, a proportion of bainitic ferrite grains having an intragranular orientation difference of less than 5° is 1% or more and less than 30% in terms of area%. An average grain size of parent phase austenite obtained by inverse analysis from crystal orientation information of a matrix structure is 80 μm or less. A number density of B-containing precipitates having a grain size of 1 μm or more present on crystal grain boundaries of the parent phase austenite is 30 particles / mm or less.SELECTED DRAWING: None
Owner:NIPPON STEEL CORPORATION

Magnetic wire, composite magnetic wire, method for manufacturing magnetic wire, and method for manufacturing composite magnetic wire

A magnetic wire made of an alloy containing iron and cobalt as main components, wherein the magnetic wire has a structure including at least an α phase of the α phase and a γ phase, the structure has a high angle grain boundary having a misorientation of 15° or more, the proportion of the area of the α phase relative to the total area of the α phase and the γ phase in a cross section of the magnetic wire is 90% or more, the average crystal grain size of the α phase in the cross section is 2.5 μm or less, and the proportion of the length of the high angle grain boundary relative to the total length of grain boundaries in the structure in the cross section is 60% or more.
Owner:SUMITOMO ELECTRIC INDUSTRIES LTD +1

Support substrate, composite substrate, electronic device, and module

A support substrate, a composite substrate, an electronic device, and a module are provided, the support substrate is made of a polycrystalline material, a number of small-angle grain boundary with a misorientation angle of 2° to 15° in the support substrate accounts for 1% to 5% of a total number of grain boundaries, and the support substrate with the specific small-angle grain boundary proportion can effectively suppress spurious signals and ensure normal filtering.
Owner:QUANZHOU SANAN INTEGRATED CIRCUIT CO LTD

Hot-rolled steel sheet

This hot-rolled steel sheet has a predetermined chemical composition, in which a metallographic structure contains, by area %, less than 3.0% of residual austenite, 15.0% or more and less than 60.0% of ferrite, and less than 5.0% of pearlite, has a ratio L60 / L7 of a length L60 of a grain boundary having a crystal misorientation of 60° to a length L7 of a grain boundary having a crystal misorientation of 7° about a <110> direction of 0.60 or more, has a standard deviation of a Mn concentration of 0.60 mass % or less, and has a tensile strength of 980 MPa or more.
Owner:NIPPON STEEL CORPORATION

METALLICATION CORRECTION FOR PV CELL CLEGILING

A method for implementing a photovoltaic device comprising: - measuring a misorientation angle θmes of a given lateral face (41d) of a rectangular or square crystalline silicon wafer with respect to a crystalline orientation '(110)', - forming conductive tracks (55, 57, 59) on the upper face, oriented to achieve a given angle α with respect to at least one first lateral face (41e) among said lateral faces, determined according to said measured misorientation angle θmes, then - performing a cleaving step to separate said wafer (40) into a first portion and a second portion. Figure for the abstract: 6.
Owner:COMMISSARIAT A LENERGIE ATOMIQUE ET AUX ENERGIES ALTERNATIVES

Thin steel sheet and method for manufacturing same

A thin steel sheet has a specific chemical composition. The thin steel sheet has a microstructure in which ferrite is present in an area fraction of 5% or more and 60% or less, as-quenched martensite is present in an area fraction of 10% or less (including 0%), retained austenite is present in an area fraction of 5% or more and 20% or less, and upper bainite, lower bainite, and tempered martensite are present in a total area fraction of more than 15% and less than 85%; BCC iron that has a misorientation of 1° or less and surrounds retained austenite having an aspect ratio of 2.5 or higher is present in an area fraction of 5% or more and 70% or less; and a top 10% of retained austenite in terms of an equivalent circular diameter has an average aspect ratio of 2.5 or higher.
Owner:JFE STEEL CORP

Hot-rolled steel sheet

This hot-rolled steel sheet has a predetermined chemical composition, in which a metallographic structure contains, by area %, more than 92.0% and 100.0% or less of martensite and tempered martensite in total, less than 3.0% of residual austenite, and less than 5.0% of ferrite, has a ratio S60 / S7, which is a ratio of a density S60 of a length of a grain boundary having a crystal misorientation of 60° to a density S7 of a length of a grain boundary having a crystal misorientation of 7° about a <110> direction, of more than 0.34 and less than 0.60, has a standard deviation of a Mn concentration of 0.60 mass % or less, and has a tensile strength of 980 MPa or more.
Owner:NIPPON STEEL CORPORATION

Method for measuring crystal misorientation of single crystal blades

The present invention relates to a method for measuring the crystal orientation difference of a single-crystal blade (10), the blade (10) comprising a material formed of dendrites (30) having a trunk (32) and branches (34) extending in a principal direction (Z'), the method comprising: defining a reference coordinate system (XYZ) for the blade, the reference coordinate system including a radial direction (Z); mechanically and chemically treating the blade (10) in a base plane (P1) to acquire a first image (I1) by photomicrography; mechanically and chemically treating the blade (10) in a comparison plane (P2) offset radially from the base plane (P1) by a distance (D) to acquire a second image (I2) by photomicrography; and processing the first and second images (I1, I2) to compare the position of the trunk (32) of each dendrite (30) in the two images (I1, I2) and thereby derive the orientation of the principal direction (Z') of the dendrite (30) relative to the radial direction (Z).
Owner:SAFRAN HELICOPTER ENGINES

Measurement and determination of crystallographic texture with respect to position

An example method includes measuring, by at least one of a polarized light device, a spatially resolved acoustic spectroscopy device, or an eddy current device, an alpha phase data set indicative of an alpha phase of a crystalline structure of a material. The method includes receiving, by processing circuitry, the alpha phase data set, wherein the alpha phase data set comprises a plurality of pixels, wherein each pixel of the plurality of pixels includes a position, a first Euler angle, a second Euler angle, and a third Euler angle, wherein the third Euler angle is missing or erroneous. The method also includes adjusting, by the processing circuitry, the third Euler angle of a pixel of the plurality of pixels and storing, by the processing circuitry and based on adjusting the third Euler angle of the pixel reducing a total beta phase misorientation, the alpha phase data set.
Owner:ROLLS ROYCE CORP

Steel sheet and outer sheet member

Provided is a steel sheet characterized by having a predetermined chemical composition and a metallographic structure, wherein, in terms of area fraction, the structure comprises 70% to 95% of bainite and 3% to 20% of martensite, the sum of bainite and martensite is 90% or above, the average intragranular misorientation of crystal grains surrounded by grain boundaries with a crystal orientation difference of 15° or above is 0.60° or below, and the proportion of crystal grains containing two or more martensite grains therein is 90% or above.
Owner:NIPPON STEEL CORPORATION