Method for measuring inverse pole figure

Abstract

The invention discloses a method for measuring an inverse pole figure. The method comprises the following steps of: determining the peak position of each diffraction peak of a sample and a standard sample and the background positions of the left and right sides of each peak; putting the sample on a 1 theta-axis of an X-ray instrument measurement device, and arranging a detector on a 2 theta-axis, wherein the 1 theta-axis and the 2 theta-axis are positioned in the position of 0 degree; acquiring the intensity of the X-ray of the diffraction peak on the detector; acquiring the background intensity of the diffraction peak; calculating the net intensity of the (hkl) diffraction peak; detaching the sample from the 1 theta-axis, loading the standard sample, and measuring the net intensity of the diffraction peak of the standard sample; calculating the ratios of the net intensity of the sample to that of the standard sample, and averaging all the ratios to obtain the net intensity of the (hkl) diffraction peak; and marking the polar density value of each (hkl) diffraction peak on the inverse pole figure of the sample, thus finishing the measurement process. The measurement result contains contribution of crystalline grains which can generate symmetrical diffraction and have small grain orientation errors on the measurement result, and the measurement result can more accurately reflect the performance of the material.

Description

technical field [0001] The invention relates to measurement technology, in particular to a method for measuring an inverse pole figure. Background technique [0002] The traditional inverse pole figure measurement method mainly uses short-wavelength monochromatic X-rays (using a wide-angle X-ray diffractometer) for polycrystal diffraction analysis, and obtains as many diffraction intensities as possible from different crystal planes. After sorting out the measured diffraction intensities, project the relevant data (polar density) onto the equatorial projection plane by means of polar eccentric projection, and then obtain an inverse pole figure, and mark the poles of different crystal planes in the inverse pole figure. The size of the density. During actual measurement, see figure 1 , under the same measurement conditions, perform symmetrical diffraction on the sample and the standard sample (the sample without texture is the standard sample) respectively (that is, the inci...

AI Technical Summary

Problems solved by technology

[0004] The technical problem to be solved by the present invention is to provide a method for measuring the inverse pole figure for the defect that the inverse pole figure measurement in the prior art does not consider the grains that have a certain misorientation with the crystal grains that can produce diffraction

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