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Analysis method for measuring large-grained silicon steel texture

An analytical method, a large-grain technology, applied in the analysis of materials, material analysis using wave/particle radiation, image analysis, etc., can solve problems such as inverse pole diagrams that cannot be used to draw large-grain silicon steel samples

Inactive Publication Date: 2014-11-19
武汉钢铁有限公司
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  • Abstract
  • Description
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  • Application Information

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Problems solved by technology

Therefore, the traditional measurement method cannot be used to draw the inverse pole figure of the large grain silicon steel sample

Method used

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  • Analysis method for measuring large-grained silicon steel texture
  • Analysis method for measuring large-grained silicon steel texture

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Experimental program
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Embodiment Construction

[0013] The present invention will be described in further detail below in conjunction with the accompanying drawings and embodiments, but these embodiments should not be construed as limiting the present invention.

[0014] In a specific embodiment of the present invention: since the surface to be tested of the silicon steel plate must be a flat surface, it meets the requirements of the electron backscattered diffraction test after polishing and other pretreatments. Then cut a piece of large-grained silicon steel of 300mm×30mm to be the area to be tested for the electron backscattered diffraction sample.

[0015] like figure 1 As shown in , mark the grain boundaries with a marker pen to divide each grain; the marked grains are numbered from 1 to 48 in sequence.

[0016] Take this sample into a photo, and use an image analyzer to measure the area of ​​each grain in the photo: A 1 to A 48 .

[0017] Calculate A 0 the size of:

[0018] When surveying and mapping, the {hkl} ...

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Abstract

The invention discloses an analysis method for measuring a large-grained silicon steel texture. The analysis method comprises the following steps: I, preparing a to-be-tested electron backscatter diffraction sample from a silicon steel plate; II, cutting a to-be-tested area of the to-be-tested electron backscatter diffraction sample, and distinguishing each crystalline grain in the to-be-tested area according to a crystal boundary; III, calculating the area Am of each crystalline grain and the total area A of the total to-be-tested areas of the sample; IV, carrying out no-texturing treatment, and calculating a ratio A0 of each crystalline grain in the to-be-tested area; V, testing an orientation (hkl) of each crystalline grain in an electron backscatter diffraction way and acquiring an absolute value; VI, dividing Am by A and then by A0 to obtain a relative pole density P(hkl); and VII, marking the relative pole density P(HKL) on a position on a corresponding crystal face in an inverse pole figure. The analysis method has the characteristic that a correct corresponding relationship between a test result and the performance of a material can be established and can be widely applied to the field of the testing of large-grained materials.

Description

technical field [0001] The invention relates to a test method for large-grain materials, in particular to an analysis method for measuring the texture of large-grain silicon steel. Background technique [0002] Due to the limitation of the external environment, the crystalline substance fails to develop into crystals with regular shapes, but only crystallizes into granules, forming grains. A polycrystal is often formed by a collection of multiple single crystals. If the number of crystal grains is large and the arrangement of each crystal grain is completely random and statistically uniform, that is, the probability of orientation in different directions is the same, the polycrystalline aggregate will be in different directions. It will macroscopically show various phenomena with the same performance. During the formation process, due to the influence of various environments or processing techniques such as external force, heat, electricity, and magnetism, the crystal grain...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N23/203G06F19/00G06T7/00
Inventor 周顺兵王志奋吴立新陈士华姚中海
Owner 武汉钢铁有限公司
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