Multi-protocol high-speed pseudo-random signal loopback test system based on FPGA
A pseudo-random signal and loopback test technology, applied in the field of multi-protocol high-speed pseudo-random signal loopback test systems, can solve the problems of low repetition rate and high price of the test system, and achieve the effects of simple operation, complete functions and low cost
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Example Embodiment
[0029] In order to make the objectives, technical solutions, and advantages of the present invention clearer, the following further describes the present invention in detail with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present invention, but not to limit the present invention.
[0030] On the contrary, the present invention covers any alternatives, modifications, equivalent methods and schemes defined by the claims in the spirit and scope of the present invention. Further, in order to enable the public to have a better understanding of the present invention, in the following detailed description of the present invention, some specific details are described in detail. Those skilled in the art can fully understand the present invention without the description of these details.
[0031] See Figure 1-4 , Including FPGA part and upper computer part 20, among which,
[00...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap