In-band OSNR measuring device and method based on fine spectrum

A measuring device and a technology for spectral measurement, applied in the field of spectral detection, can solve the problems of difficulty in meeting application requirements, large deviation, and increased measurement time, and achieve the effect of high-precision measurement
CN112082647AActive Publication Date: 2020-12-15CHINA ELECTRONIS TECH INSTR CO LTD

Patent Information

Authority / Receiving Office
CN Β· China
Patent Type
Applications(China)
Current Assignee / Owner
CHINA ELECTRONIS TECH INSTR CO LTD
Publication Date
2020-12-15

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Abstract

The invention discloses an in-band OSNR measuring device and method based on a fine spectrum. The device comprises a to-be-measured light input module, a polarization modulation module, a fine spectrum measuring module and a processing and analyzing module. The to-be-measured light input module regulates and controls the power of the to-be-measured signal light, so that the power level of the to-be-measured signal light meets subsequent processing requirements; the polarization modulation module performs polarization processing on the signal light to be measured so as to eliminate the influence of the polarization effect of the signal light to be measured on the in-band OSNR measurement precision; the fine spectral measuring module sequentially acquires fine spectral information of pm resolution of the optical transmission signal component and the noise component which are separated by the polarization modulation module; the processing and analysis module supports the adoption of a polarization zeroing method, a differential spectral response method, a differential spectral resolution bandwidth identification method, a noise fitting method and other in-band OSNR inversion algorithms, and achieves the high-precision measurement of the in-band OSNR of a high-speed optical transmission system.
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Description

technical field

[0001] The invention relates to the field of spectrum detection, in particular to an in-band OSNR measurement device and method based on fine spectrum. Background technique

[0002] Spectral analysis is a key diagnostic tool in optical applications such as communications, sensing, molecular spectrometers, and microwave generation. For example, optical methods are used to measure spectral parameters of ultra-high-speed signals transmitted in optical fiber communication systems, and the signal quality of transmitted signals can be obtained. , OSNR, bit error rate and other information are an effective means of diagnosing and monitoring transmission signals. In particular, OSNR, or Optical Signal-to-Noise Ratio, as one of the most useful parameters for estimating signal quality directly in the optical link layer, has drawn great attention from the industry. OSNR has long been considered as a key performance indicator of dense wavelength division multiplexing sy...

Claims

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