In-band OSNR measuring device and method based on fine spectrum
Patent Information
- Authority / Receiving Office
- CN Β· China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- CHINA ELECTRONIS TECH INSTR CO LTD
- Publication Date
- 2020-12-15
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Figure 1
Abstract
Description
technical field
[0001] The invention relates to the field of spectrum detection, in particular to an in-band OSNR measurement device and method based on fine spectrum. Background technique
[0002] Spectral analysis is a key diagnostic tool in optical applications such as communications, sensing, molecular spectrometers, and microwave generation. For example, optical methods are used to measure spectral parameters of ultra-high-speed signals transmitted in optical fiber communication systems, and the signal quality of transmitted signals can be obtained. , OSNR, bit error rate and other information are an effective means of diagnosing and monitoring transmission signals. In particular, OSNR, or Optical Signal-to-Noise Ratio, as one of the most useful parameters for estimating signal quality directly in the optical link layer, has drawn great attention from the industry. OSNR has long been considered as a key performance indicator of dense wavelength division multiplexing sy...