Test system supporting log file configuration

A technology of file configuration and test system, which is applied in software testing/debugging, electronic circuit testing, electrical measurement, etc., can solve the problem of high risk of loss of test process records, avoid excessive recording information, improve recording effect, and optimize resources The effect of the configuration

Pending Publication Date: 2021-05-25
杭州广立测试设备有限公司
View PDF0 Cites 1 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, in the current technology, the file records that cannot be done during the test process are complete enough, and the risk of loss of test process records is high.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Test system supporting log file configuration
  • Test system supporting log file configuration

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0031] Such as figure 1 As shown, a test system that supports log file configuration disclosed in the embodiment of the present invention includes: a workstation 1, a test machine 2 and a probe station 3; the workstation 1, the test machine 2 and the probe station 3 are sequentially connected by communication , and perform signal transmission; the probe station 3 is provided with a probe card 31 and a wafer box 32, the wafer box to be tested 321 is placed in the wafer box, and the probe card 31 is connected to the wafer to be tested 321; the workstation 1 It includes a memory 11 and a processor 12; the memory 11 stores a test program, and the test program supports log file configuration; the test program is run by the processor to generate multiple log files according to the configuration. The log files in this embodiment include log files related to the test process and log files related to the test status. In this embodiment, the signal transmission process in the test work...

Embodiment 2

[0061] Such as figure 2As shown, the main difference between the second embodiment and the first embodiment is that a test system that supports log file configuration disclosed in this embodiment also includes a server 4, which is connected by communication with the workstation 1; in this embodiment, the log file is stored in the server 4 on. Of course, in some embodiments, the log files are stored on both the workstation 1 and the server 4, which is not limited. In addition, different from Embodiment 1, the log file in this embodiment also includes log files related to inspection results, specifically, the output of the Self testlog is the hardware and communication inspection results of the current machine. The inspection items involved in the results displayed by Self test log in this embodiment include 13 items, specifically GPIB: whether the GPIB communication module can communicate normally; ControlBus: whether the control bus is working normally; SMU: Source Measureme...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention provides a test system supporting log file configuration. The test system comprises a workstation, a test machine and a probe station, the work station, the test machine and the probe station are in communication connection in sequence and perform signal transmission. The workstation comprises a memory and a processor; the memory stores a test program, and the test program supports log file configuration; the log files comprise the log file related to the test process, the log file related to the test state and the log file related to the check result, information such as the test process, the test state and the abnormal problem can be displayed, records are not prone to loss, the record content is complete, and the test information recording effect and the problem solving efficiency can be improved.

Description

technical field [0001] The invention belongs to the technical field of semiconductor testing, and in particular relates to a testing system supporting log file configuration. Background technique [0002] The manufacturing process of integrated circuits is very complicated and the cost is very high. Therefore, as an important means of discovery research and discovery of yield, integrated circuit testing occupies an indispensable position. The current advanced integrated circuit design and manufacturing capabilities provide a huge support for the realization of more powerful chips with more functions and performance. challenge. The market needs low-cost, high-performance and fast-to-market products. If test program designers cannot quickly and effectively complete the test program, it will become a bottleneck in mass production and shipment, delaying the time to market and causing great economic losses. . These all show that in the whole process from R&D to production and ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/28G06F9/445G06F11/36
CPCG01R31/2851G06F9/44505G06F11/3696
Inventor 李成霞毛俊杨文浩
Owner 杭州广立测试设备有限公司
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap