Shape analysis method and shape analysis program

a shape analysis and program technology, applied in the direction of mechanical measurement arrangements, instruments, using mechanical means, etc., can solve the problems of inexperience, time and effort, complex input operation, etc., to improve operability and stabilize evaluation

Active Publication Date: 2014-01-02
MITUTOYO CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Benefits of technology

[0018]An object of the invention is to provide a shape analysis method and a shape analysis program capable of improving operability and stabilizing evaluation by automating or semi-automating specification of an evaluation range in the case of analyzing shape measured data.

Problems solved by technology

Such input operation is very complicated and has a problem of requiring time and effort.
Inexperience takes considerable time and further, plural evaluation targets require substantial time.
On the other hand, the edge portion naturally has deformation such as shear drops or burrs, so that when too wide a range S3 is specified, there is fear that a circular arc cannot be applied well.

Method used

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  • Shape analysis method and shape analysis program
  • Shape analysis method and shape analysis program

Examples

Experimental program
Comparison scheme
Effect test

first embodiment

[0068]The case of applying the invention to a contour shape measuring apparatus will be described by way of example.

[0069]FIG. 1 is a diagram showing the whole configuration of a shape measuring system 100.

[0070]The shape measuring system 100 includes a shape measuring machine 200, and a computer system 300 for controlling this shape measuring machine 200.

[0071]A configuration of the shape measuring machine 200 is known, and will be described briefly.

[0072]The shape measuring machine 200 includes a table 210 on which work W is placed, a probe 220 for scanning a surface of the work placed on the table 210, a driving mechanism part 230 for moving the probe 220 with the probe 220 brought into contact with the work W, and sensors (241, 242, 243) for detecting a position of the probe 220.

[0073]On the table 210, the work W is placed on a placement stand 211, and this placement stand 211 is further placed on the table 210.

[0074]The driving mechanism part 230 includes a probe holding part 2...

embodiment

Outline of Embodiment

[0081]An outline of the embodiment will be described before detailed description using a functional block diagram or a flowchart.

[0082]The functional block diagram or the flowchart will be described below after the outline description. This is because previous understanding of the outline probably facilitates understanding of a meaning of the invention.

[0083]The embodiment is characterized by a shape analysis program.

[0084]Particularly, an evaluation range is generated semi-automatically. Typically, a user automatically generates an evaluation range to calculate geometric properties by only one click (or one tap) on a screen. Hence, shape analysis operation by the embodiment is called one-click operation. As geometric elements used in shape analysis, a circle, a line and a point are typically given.

[0085]An outline of a method for executing shape analysis using the circle, the line and the point with one click will be described sequentially.

[0086]In addition, in...

first operation example

[0136]A procedure of operation of the embodiment will be described.

[0137]The case of obtaining straightness of a line segment will be described as a first operation example.

[0138]The procedure of operation of the embodiment broadly includes initialization (ST100), work shape measurement (ST200), and shape evaluation analysis (ST300) as shown in a flowchart of FIG. 15.

[0139]In the initialization (ST100), conditions necessary for one-click operation are preset. The conditions include setting of a tolerance threshold (FIG. 10), priority of an evaluation range (FIG. 12) and setting of a shift amount (FIG. 13).

[0140]When the initialization (ST100) is completed, a shape of work W targeted for evaluation is measured. That is, contour shape data of the work W is acquired using the shape measuring machine shown in FIG. 1. The shape data is stored in memory (for example, nonvolatile memory) of the inside of the host computer 310.

[0141]In order to verify working accuracy of this work W after t...

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PUM

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Abstract

A shape analysis method for analyzing shape data acquired by measuring a contour shape of a workpiece to be measured, includes: deciding a geometric element used in shape analysis; deciding one data point to be included in an evaluation range; applying the geometric element to an interval including the one data point; searching the widest interval for satisfying a threshold condition of a preset shape tolerance while changing a width of the interval; pinpointing two boundary points between which the interval found by the search is sandwiched; obtaining two edge points at which the two boundary points are respectively shifted by preset shift amounts; setting a range sandwiched between the edge points in the evaluation range; and targeting the shape data within the evaluation range for calculation of geometric properties.

Description

CROSS-REFERENCE TO RELATED APPLICATION (S)[0001]This application is based upon and claims the benefit of priority from Japanese Patent Application No. 2012-148463, filed on Jul. 2, 2012, the entire contents of which are incorporated herein by reference.BACKGROUND[0002]1. Field of the Invention[0003]The present invention relates to a shape analysis method and a shape analysis program. Concretely, the invention relates to the shape analysis method for analyzing shape measured data obtained by measuring a contour shape of a workpiece to be measured and calculating or evaluating geometric properties such as roundness, a center position or dimensions of the contour shape. More particularly, the invention relates to the art of specifying an evaluation range in the case of analyzing a shape.[0004]2. Description of the Related Art[0005]Various shape measuring apparatuses for measuring a contour shape of a workpiece to be measured are known. Contour shape data of the workpiece to be measured...

Claims

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Application Information

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Patent Type & Authority Applications(United States)
IPC IPC(8): G01B21/20
CPCG01B21/20G01B5/201G01B5/24
Inventor SHIMIZU, MASAFUMISAITO, YOICHI
Owner MITUTOYO CORP
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