The invention relates to a micro photosensitive surface
avalanche transistor center alignment device and a
correction method thereof. The device comprises a
pipe pressing ring 1, a
pipe sleeve 2, a
pipe pressing ring 3, a group pressing ring 4, an adjusting screw 5, an
avalanche transistor 6, a matched universal tool
microscope 7 and a matched screwdriver 8. During correction, a universal tool
microscope 7 is used for reading the relative coordinates of the outer edge of the tube pressing ring 3 and the center of the photosensitive surface of the avalanche tube, the four adjusting screws 5 are adjusted up, down, left and right after the relative position of the tube pressing ring 3 and the center of the photosensitive surface of the avalanche tube is calculated, and the adjusting screws 5 are used for pushing the tube sleeve 2 and the avalanche tube 6 to move until the coaxiality of the center of the photosensitive surface of the avalanche tube and the outer edge of the tube pressing ring 3 is smaller than 0.03 mm. Therefore, the aim of alignment is fulfilled. The device is mainly used for center calibration of the
avalanche transistor with the photosensitive surface
diameter not larger than 0.2 mm, has the advantages of being simple in structure, efficient in reset, accurate, stable and the like, and can be applied to occasions with high precision, high speed, high reliability and the like.