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Vacuum ultraviolet hemisphere reflectivity testing device

A hemispherical reflectance and vacuum ultraviolet technology, which is applied in the field of vacuum ultraviolet spectral transmission testing, can solve the problem that the vacuum ultraviolet hemispherical reflectance cannot be accurately measured, and achieve the effect of improving energy transmission efficiency

Inactive Publication Date: 2012-07-04
CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI
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Problems solved by technology

[0003] In order to solve the technical problem that the vacuum ultraviolet hemispherical reflectance cannot be accurately measured, the present invention provides a vacuum ultraviolet hemispherical reflectance test device, the monochromator adopts the Seya-Namioka structure, and the signal receiving system adopts the structure combining the fluorescent integrating sphere and the detector

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Embodiment Construction

[0009] The present invention will be further described in detail below in conjunction with the drawings and embodiments.

[0010] Such as figure 1 with figure 2 As shown, the vacuum ultraviolet hemispherical reflectance test device of the present invention includes a deuterium lamp light source 1, a toroidal mirror 2, a Seya-Namioka monochromator, a first collimating mirror 6, a second collimating mirror 7, and a chopper. 8, fluorescence integrating sphere, sample 10, diffuse transmission filter 13, detector 14, precision turntable 15, data acquisition system 17, computer 18 and vacuum tank 19; the Seya-Namioka monochromator includes monochromator input Slot 3, wavelength driving mechanism 16, concave grating 4 and monochromator exit slot 5; the fluorescent integrating sphere includes a fluorescent integrating sphere opening 9, an inner wall 11 of the integrating sphere coated with a fluorescence conversion film, and a detector opening 12; Placed on the precision turntable 15, ...

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Abstract

A vacuum ultraviolet hemisphere reflectivity testing device belongs to the field of vacuum ultraviolet spectrum transmission testing and comprises a deuterium lamp light source, a toroid mirror, a Seya-Namioka monochrometer, an alignment reflector, a photochopper, a fluorescent integrating sphere coated with a fluorescent conversion film on the inner wall, a sample, a diffuse transmission light filter, a detector, an accurate rotary table, a wavelength driving mechanism, a data collection system, a computer and a vacuum tank. All optical elements of the testing device are of reflection structures, a light division system adopts the Seya-Namioka monochrometer, a IV type phase difference elimination concave face grating with large numerical is adopted at a light division element of the monochrometer, and efficient transmission of vacuum ultraviolet spectrum energy is guaranteed. A receiving system of the detector adopts the scheme of the fluorescent integrating sphere, thereby avoiding excess energy loss after vacuum ultraviolet beams are reflected mangy times on the inner wall of the integrating sphere. By means of two working models (sample / reference), absolute measurement of the vacuum ultraviolet hemisphere reflectivity is achieved.

Description

Technical field [0001] The invention belongs to the field of vacuum ultraviolet spectrum transmission testing, and relates to a vacuum ultraviolet hemispherical reflectivity test device. Background technique [0002] Vacuum ultraviolet spectroscopy measurement technology has become a hot spot in international research in recent years, and the hemispherical reflectance test of diffuse reflection optical elements is of great significance to improve the research of vacuum ultraviolet spectroscopy technology. In the visible and infrared bands, the hemispherical reflectance measurement has been mature, and the measurement method combining monochromator and integrating sphere is mainly used. However, in the vacuum ultraviolet band, the spectral transmission efficiency is low, and the commonly used inner wall materials of the integrating sphere cannot be used. At present, there is still no solution for measuring the hemispherical reflectance of diffuse reflection samples in the vacuum ...

Claims

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Application Information

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IPC IPC(8): G01J3/42G01J3/26G01M11/02
Inventor 李博王淑荣林冠宇黄煜王俊博
Owner CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI
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