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Nonvolatile memory device and method for fabricating the same

A non-volatile storage and device technology, used in semiconductor/solid-state device manufacturing, static memory, read-only memory, etc., can solve problems such as inability to form word lines 12 correctly, collapse of trim areas, and difficulty in forming devices.

Active Publication Date: 2012-07-04
SK HYNIX INC
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0009] However, the trimmed area is likely to collapse due to thermal stress in the sacrificial layer (nitride layer) lift-off process and subsequent ONO process
Therefore, the word line 12 cannot be correctly formed, thus making it difficult to form the device

Method used

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  • Nonvolatile memory device and method for fabricating the same
  • Nonvolatile memory device and method for fabricating the same
  • Nonvolatile memory device and method for fabricating the same

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Embodiment Construction

[0039] Exemplary embodiments of the present invention will be described in more detail below with reference to the accompanying drawings. However, this invention may be embodied in various forms and should not be construed as limited to the embodiments set forth herein. Rather, these embodiments are provided so that this description will be thorough and complete, and will fully convey the scope of the invention to those skilled in the art. In this specification, the same reference numerals denote the same parts in the various drawings and embodiments of the present invention.

[0040] The drawings are not to scale and in some instances proportions may have been exaggerated in order to clearly illustrate features of the embodiments. When referring to a first layer being "on" a second layer or "on" a substrate, it refers not only to the case where the first layer is formed directly on the second layer or on the substrate, but also to the case where the first layer is formed wit...

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Abstract

Provided are a nonvolatile memory device and a method for fabricating the same, which can secure the structural stability of a three-dimensional nonvolatile memory device. The nonvolatile memory device includes one or more columnar channel plugs, a plurality of word lines and a plurality of dielectric layers stacked alternately to surround the columnar channel plug, a memory layer disposed between the word line and the columnar channel plug, a plurality of word line connection portions, each of the word line connection portions connecting ends of word lines of a common layer from among the plurality of word lines, and a plurality of word line extension portions extending from the word line connection portions.

Description

[0001] Cross References to Related Applications [0002] This application claims priority from Korean Patent Application No. 10-2010-0140510 filed on Dec. 31, 2010, the entire contents of which are hereby incorporated by reference. technical field [0003] Exemplary embodiments of the present invention relate to a semiconductor device and a method of manufacturing the same, and more particularly, to a nonvolatile memory device and a method of manufacturing the same. Background technique [0004] In order to use word lines as metal in 3D flash devices, after forming channel plugs such as in terabit cell array transistors (TCAT), the sacrificial layer is stripped and oxide / nitride / oxide object (ONO) layer and metal. Then, word lines are formed through an isolation process. [0005] Figure 1A is a perspective view of a conventional nonvolatile memory device. Figure 1B yes Figure 1A layout. [0006] see Figure 1A and Figure 1B , a plurality of trench plugs 11 are forme...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H01L27/115G11C16/06
CPCH01L29/7926H01L27/11582H01L27/11565H10B43/10H10B43/50H10B43/27H01L21/823475H10B63/84
Inventor 李起洪洪权金旻秀
Owner SK HYNIX INC
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