Method for online detecting electronic element by translational type micro focus CT (Computerized Tomography) detection device

Abstract

The invention discloses a method for online detecting an electronic element by a translational type micro focus CT (Computerized Tomography) detection device, and the method is realized as follows: when the detection is started, the electronic element is scanned by a conical ray beam generated by a ray generation device; and ray projection data is acquired by a ray detection and data acquisition device, and then is transmitted to a control and image processing system for imaging including digital radiation (DR) imaging and computerized tomography (CT) imaging. When the CT imaging is performed, the CT image can be reconstructed according to incomplete projection data acquired through ray scanning by the translational type conical beam and adopting translational type conical beam CT iterative reconstruction algorithm based on subdomain equalization and total variation minimization, so as to obtain a high quality three-dimensioanl CT image. The method is used for online detecting the electronic element on the production line with high precision, can perform amplification DR image and three-dimensional CT image for internal and external structures of the electronic element; the device has simple structure and high scanning efficiency; and further, material deficiency and assembly deficiency of the electronic element can be detected efficiently.

Description

technical field [0001] The invention relates to a defect detection method for electronic components, in particular to a method for online detection of electronic components by a translational micro-focus CT detection device. Background technique [0002] Electronic component defect detection is an essential stage in the process of manufacturing electronic components in industries such as national defense and military, automotive electronics and high-end communication equipment. The defects of electronic components directly affect the performance and quality of electronic components. Effective identification of printing defects, pin spacing, soldering Defects such as the number of dots, air bubbles, small impurities, cracks, missing prints, repeated feeding, or incorrect positioning are important means to improve the yield and performance of electronic component products. [0003] The structure of the micro-focus CT imaging system used for small animals in the prior art [Yang...

AI Technical Summary

Problems solved by technology

However, the cost of the dual-energy X-ray generating device is relatively hi

Images