A method for rapidly extracting RCS information in a wide angle range of a target

A fast information and extraction method technology, applied in the direction of radio wave measurement systems, instruments, etc., can solve the problems of not being able to fully express the scattering characteristics of the target and low information utilization, and achieve fast speed, wide application range, and good adaptability Effect

Active Publication Date: 2014-03-26
中国航天科工集团第二研究院二〇七所
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Problems solved by technology

[0003] For a long time, the analysis of target RCS characteristics has been limited to statistical parameters such as mean, root mean square, and median. This method has the advantages of simplicity and strong operability, but its information utilization rate is extremely low, and it cannot fully express the scattering characteristics of the target.

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  • A method for rapidly extracting RCS information in a wide angle range of a target
  • A method for rapidly extracting RCS information in a wide angle range of a target
  • A method for rapidly extracting RCS information in a wide angle range of a target

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Embodiment Construction

[0025] The present invention will be described in detail below with reference to the accompanying drawings and specific embodiments.

[0026] like figure 1 As shown, a fast information extraction method for a target wide-angle range RCS according to the present invention includes the following steps:

[0027] Step 1: Establish a typical target feature distribution database

[0028] Measure the backscattering cross sections of typical targets at different incident angles, and obtain the statistical distribution function of the scattered electric field intensity of the typical targets. On this basis, collect the characteristic distributions of common typical targets and structures, and establish a typical structure scattering database as a reference database; like figure 2 As shown in the figure, it is the characteristic distribution function of the backscattering of the plate point frequency with the azimuth angle. The results show that the distribution function has two peak...

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Abstract

The invention belongs to the technical field of signal characteristic control and specifically relates to a method for rapidly extracting RCS information in a wide angle range of a target. The method comprises following steps of: measuring backscattering cross sections of different incidence angles of a typical target in order to obtain a statistical distribution function of the scattering electric field intensity of the typical target; establishing a typical structural scattering database in combination with common typical target and structural characteristic distribution on that basis, wherein the typical structural scattering database is to be used as a reference database; inputting a wide-angle range RCS data to be analyzed of a real target; performing angle/frequency subspace decomposition on RCS data inputted in the step 2 according to a real operating bandwidth of a certain kind of radar and a possibly-generated observation angle variation range of an aircraft; obtaining a characteristic distribution function of a certain subspace of the real target decomposed in the step 3; and achieving rapid determination of a target type or a main scattering characteristic according to the typical target characteristic database established in the step 1 and the characteristic distribution function of the certain subspace of the real target obtained in the step 4.

Description

technical field [0001] The invention belongs to the technical field of signal feature control, and in particular relates to a fast information extraction method for RCS of a target with a large angle range. Background technique [0002] In terms of target electromagnetic characteristic analysis, target recognition, scattering feature extraction and stealth shaping design, it faces a large number of target RCS data rapid analysis and processing problems. For example, in the design process of stealth shaping, it is necessary to go through multiple optimization iterations, and for each optimization process, RCS calculation must be performed to check and confirm its optimization effect. At this time, in addition to the traditional direct comparison of RCS changes , it is also necessary to quickly obtain the changes of the main scattering characteristics of the target, such as specular scattering, edge diffraction, and multiple scattering. In terms of target recognition, it is n...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01S7/41
CPCG01S7/415
Inventor 侯兆国李粮生闫华
Owner 中国航天科工集团第二研究院二〇七所
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