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Management device and management method

A technology for managing devices and characteristic values, applied to measuring devices, total factory control, instruments, etc., can solve problems such as difficulty in judging measurement errors of measuring devices

Inactive Publication Date: 2016-09-21
ORMON CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, in the actual production line, there are not only Figure 14 In the case of (a) where only one histogram is significantly different, it may sometimes be as Figure 14 As in (b) above, there are cases where the histograms of the respective measuring instruments are slightly different from each other
In the latter case, it is difficult to judge whether there is a measurement error between the measuring instruments only by the difference between the average value of the measurement values ​​of each measuring instrument and the average value of the measuring values ​​of all measuring instruments

Method used

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  • Management device and management method
  • Management device and management method

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Embodiment Construction

[0043] Hereinafter, an embodiment of the present invention will be described in detail with reference to the accompanying drawings. figure 1 It is a schematic configuration diagram of a measurement device error management system according to an embodiment of the present invention.

[0044] The measuring instrument error management system 1 of the present embodiment includes a production line 10 , a measurement data collection device 20 , a database 30 , a management device 40 , and an operation recording device 50 .

[0045] In this embodiment, the production line 10 includes: first to third production steps for producing products; and an inspection step for inspecting various characteristics of workpieces as intermediate products or final products. figure 2 It is a schematic diagram of the number of devices owned by each step. Here, in order to keep the processing speed of each step approximately constant, the first to third production steps have 8, 3, and 1 production equ...

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Abstract

A management device (40) acquires a measurement data group comprising a plurality of property values obtained by a plurality of measuring instruments (11) that measure the properties of an introduced workpiece, and calculates parameters for indicating measurement error between the measuring instruments on the basis of the measurement data group.

Description

technical field [0001] The present invention relates to a management device for managing measurement errors between measuring instruments used on a production line. Background technique [0002] Conventionally, product lines have been equipped with an inspection process for inspecting various properties of workpieces as final products or intermediate products. Measuring devices used to determine characteristics are used in this inspection step. If the measurement value measured by the measuring device falls within the specified range, it is judged that the product is a good product, and if it does not fall within the specified range, it is judged that the product is a defective product. [0003] Usually, when a measuring device performs measurement, it takes a long time to process one workpiece, so multiple measuring devices are used for parallel processing. When parallel processing is performed using multiple measuring instruments like this, measurement errors between mea...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01M99/00G01B21/00G01D18/00
CPCG05B19/41875Y02P90/02
Inventor 杉原史郎
Owner ORMON CORP