An exposure time, frame rate and smear test device and test method thereof

A technology of exposure time and testing device, applied in optics, photography, instruments, etc., can solve problems such as difficult adjustment of exposure time

Active Publication Date: 2017-11-28
SHENZHEN MINGYUTONG DETECTION CO LTD
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Problems solved by technology

[0003] In order to overcome the above defects, the object of the present invention is to provide a test device for exposure time, frame rate and smear and its test method. The test device and method overcome the defect that the exposure time of the image acquisition system under test is difficult to adjust. Measurements are still possible in bright environments

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  • An exposure time, frame rate and smear test device and test method thereof

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Embodiment Construction

[0023] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.

[0024] Please refer to figure 1 , a kind of exposure time, frame rate and smear test device of the present invention, this test device comprises:

[0025] A target plate 1, which is provided with a distinguishable pattern 2, the target plate 1 is a visual plate, and after rotating at a constant speed, the angle and position change of the distinguishable pattern 2 on it is measured. The pattern 2 can also be any Other carriers that can distinguish angles and position changes, such as marks, raised points, colored blocks, etc., the target plate 1 is preferably a circular body;

[0026] Rotating pow...

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Abstract

The invention relates to a test device and test method for exposure time, frame rate and smear. The test device and method use a brightness adjustment mechanism to adjust the brightness of the target plate, and the rotating power part drives the target plate to rotate at a preset angular speed at a constant speed. The image acquisition system under test takes pictures and videos of the target plate. Recognizable patterns, the single-frame rotation angle of the target plate is obtained through the angle and position changes of the pattern, and the preset angular velocity of the known target plate is known, and then the exposure time of the image acquisition system is calculated; two adjacent frames in the recorded video The frame rate of the image acquisition system is calculated by the rotation angle between the corresponding points and the preset angular velocity; the length of the smear generated by the image acquisition system is calculated from the amount of deformation of the pattern in the photo, and the test device and method overcome the problem of the measured image Defects that are difficult to adjust the exposure time of the acquisition system can still be measured in a bright environment.

Description

technical field [0001] The invention relates to a test device for exposure time, frame rate and smear and a test method thereof, which is oriented to any image acquisition system. Background technique [0002] The length of the exposure time has a direct impact on the exposure amount. In order to ensure the correct exposure amount, the exposure time needs to be precisely controlled. Generally, the method of testing the exposure time of the image acquisition system is to take pictures of LED light groups that flash rapidly and sequentially, and judge the exposure time according to the number or length of the LEDs that are lit up in the photo, but there are some disadvantages in this test method. The exposure time of the measurement image acquisition system is difficult to adjust, and it is difficult to measure in a bright environment. Contents of the invention [0003] In order to overcome the above defects, the object of the present invention is to provide a test device f...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G03B43/00
Inventor 翟小鹏姚学文
Owner SHENZHEN MINGYUTONG DETECTION CO LTD
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