Infrared image-based photovoltaic array fault grading method

An infrared image and fault level technology, applied in the monitoring of photovoltaic power generation, photovoltaic modules, photovoltaic systems, etc., can solve the problems of cumbersome data preprocessing, long work cycle of manual data collection, and complex model construction.

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Problems solved by technology

This method needs to consider environmental information such as illumination, ambient temperature, and wind speed from different types of sensors. Therefore, the manual data collection in the early stage has a long working cycle and heavy workload, and the data preprocessing is more cumbersome, and the model construction is complicated. Analysis and diagnosis of a single image cannot achieve rapid analysis and diagnosis of a large number of images

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  • Infrared image-based photovoltaic array fault grading method

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Embodiment Construction

[0042] In the following, the present invention will be described in more detail by taking the division of fault levels of the image units in the infrared image of the photovoltaic array as an example.

[0043] The method for classifying faults of photovoltaic arrays based on infrared images in the present invention has the following steps:

[0044] Step 1: First collect the infrared image information of the photovoltaic array system, the collected information includes 1 = 6 infrared images of photovoltaic modules and their temperature information, and the image information of each image divided into λ = 9 image units; the collected original infrared The image information constitutes the image information database, that is, the three-dimensional tensor of l×λ×υ X , the three dimensions represent the number of infrared images of photovoltaic modules l, the number of image segmentation units λ, and the number of information characteristic variables υ of each image unit, and the R...

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Abstract

The invention discloses an infrared image-based photovoltaic array fault grading method. According to the infrared image-based photovoltaic array fault grading method, infrared image information of a photovoltaic array system is collected; the infrared image information comprises a plurality of infrared images of a photovoltaic module; each image is divided into a plurality of image units; R, G and B values of each unit form an image information database tensor; fault coding is carried out on the infrared images according to obtained temperature information of the photovoltaic module; a fault grade vector is predicted through the image information database tensor by a Tensor-V hybrid partial least square method, so that a tensor-vector fault grading model is built, and has high predictive ability; rapid and effective fault grade coding on the infrared images of the photovoltaic module can be achieved; and the rapid and effective fault grade coding is supplied to photovoltaic power station operation and maintenance workers to arrange maintenance and replacement for the faulty photovoltaic module, so that an operation of the photovoltaic module in a constant optimum state is achieved; and economic benefits of a photovoltaic power plant are ensured.

Description

technical field [0001] The invention relates to a method for classifying fault levels of photovoltaic arrays, in particular to a method for classifying fault levels of photovoltaic arrays based on infrared images. Background technique [0002] As a sustainable green energy, solar energy has the advantages of cleanliness and high efficiency. As a big country in energy production and consumption, the development of solar photovoltaic power generation is an ideal choice for my country to solve energy demand and optimize energy structure. In the process of photovoltaic power generation, photovoltaic cell components convert solar energy into electrical energy, which is the main factor affecting the efficiency of photoelectric conversion. With the rapid development of the photovoltaic industry, problems such as photovoltaic array operation status detection are gradually exposed. Due to the component packaging process and other reasons, when the component has been in operation fo...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H02S50/10
CPCY02E10/50
Inventor 曹晖张盼盼严兴宇傅松玮杜春野
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