Self-aligned two-dimensional crystal material field-effect semiconductor device and its preparation method

A two-dimensional crystal and self-alignment technology, which is applied in semiconductor/solid-state device manufacturing, semiconductor devices, transistors, etc., can solve the problems of difficult application of integrated circuits, low switching, etc., to reduce parasitic resistance, reduce covering capacitance, avoid The effect of destruction

Inactive Publication Date: 2019-01-04
UNIV OF ELECTRONICS SCI & TECH OF CHINA
View PDF4 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The main problem of graphene is that the band gap is zero, and the switching ratio of semiconductor devices based on graphene materials is relatively low, which makes it difficult to apply in integrated circuits.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Self-aligned two-dimensional crystal material field-effect semiconductor device and its preparation method
  • Self-aligned two-dimensional crystal material field-effect semiconductor device and its preparation method
  • Self-aligned two-dimensional crystal material field-effect semiconductor device and its preparation method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0084] The method for preparing a self-aligned two-dimensional crystal material field-effect semiconductor device of the present invention comprises the following steps:

[0085] (1) Select a silicon (SOI) wafer on an insulating substrate as the base, select a suitable mask as a mask, etch the top silicon of the SOI until the buried oxide layer in the SOI is exposed, and the rest after etching The silicon on top of the SOI is the gate electrode of the device.

[0086] (2) Form a layer of good-quality silicon dioxide dielectric on the upper surface and side surfaces of the silicon gate electrode on the top layer of SOI.

[0087] (3) Depositing metal on the surface of the SOI substrate, the thickness of the metal layer is greater than the depth of the existing grooves on the surface of the SOI substrate.

[0088] (4) The metal layer is planarized by using a planarization process, and the process is controlled so that the silicon dioxide on the upper surface of the silicon gate ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

A self-aligned two-dimensional crystal material field effect semiconductor device and a preparation method thereof belong to the technical field of semiconductor devices. The semiconductor device of the present invention includes a gate electrode region, a source electrode region, and a drain electrode region, and is characterized in that it also includes a two-dimensional crystal material layer, the two-dimensional crystal material layer is connected to the source electrode and the drain electrode, and straddles the gate electrode region Partially, there is a gate dielectric oxide layer between the two-dimensional crystal material layer and the gate electrode region below it. Using the self-alignment process of the invention can automatically realize the alignment of the device gate electrode and the source and drain electrodes, thereby greatly reducing the covering capacitance between the gate and the source and drain electrodes, which is of great significance for improving the operating frequency of the device. On the other hand, the self-aligned device structure of the gate and the source and drain electrodes greatly reduces the parasitic resistance of the channel layer between the gate electrode and the source electrode and between the gate electrode and the drain electrode, that is, the two-dimensional crystal material, which is also beneficial. It is beneficial to increase the operating frequency of the device.

Description

technical field [0001] The invention relates to a self-aligned two-dimensional crystal material-based field-effect semiconductor device structure and a preparation method thereof, belonging to the technical field of semiconductor devices. Background technique [0002] Driven by Moore's Law, the size of semiconductor devices based on single crystal silicon materials is getting smaller and smaller, the density of integrated circuits is getting higher and higher, power consumption is getting lower and lower, the performance of chips is getting stronger, and the cost is getting lower and higher. Low. However, with the gradual reduction of the critical dimensions of the semiconductor process, the semiconductor process is getting closer and closer to the physical limit of the semiconductor, and it is difficult to continue shrinking. [0003] Moore's Law is coming to an end, but the pace of information technology advancement will not slow down. Researchers from all over the world...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & AuthorityPatents(China)
IPC IPC(8): H01L29/04H01L29/10H01L29/78H01L21/336H01L21/34
CPCH01L29/04H01L29/1033H01L29/66045H01L29/66575H01L29/66969H01L29/78
Inventor王刚李平张庆伟
OwnerUNIV OF ELECTRONICS SCI & TECH OF CHINA