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Sample inspection system, information processing device and information processing method

A technology for inspecting systems and samples, applied to measuring devices, instruments, scientific instruments, etc., to achieve the effect of efficient naked eye inspection

Active Publication Date: 2019-02-19
SYSMEX CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] However, it is necessary to observe the amount and state of various formed components in the visual inspection, and to accurately inspect even casts that rarely appear, which is a great burden on the inspection technicians. efficiency

Method used

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  • Sample inspection system, information processing device and information processing method
  • Sample inspection system, information processing device and information processing method
  • Sample inspection system, information processing device and information processing method

Examples

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Embodiment Construction

[0046] Preferred embodiments of the present invention will be described in detail below with reference to the accompanying drawings.

[0047] Such as figure 1 As shown, the sample inspection system 10 has a urine qualitative device 20 , a urine sediment device 30 , a transport device 40 , an information processing device 50 and a microscope 60 . The transport device 40 transports the sample rack 12 on which a plurality of sample containers 11 are placed. The sample container 11 is used to contain a sample collected from a subject. The sample inspection system 10 of this embodiment is planned to be installed in a hospital, so samples are collected from patients.

[0048] The urine qualitative device 20 analyzes the chemical components in urine for a plurality of analysis items related to the urine qualitative. The analysis items refer to the types of chemical components to be analyzed, and the analysis items of the urine qualitative device 20 include glucose (GLU), protein (...

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Abstract

The sample inspection system 10 includes a urine sediment device 30 and an information processing device 50 . The information processing device 50 has a control section 51 , a display section 53 and an input section 54 . The control section 51 causes the display section 53 to display an interface 100 having: a reference information display area 120 for displaying the analysis result of the sample received from the urine sediment device 30 , and a display area 120 used in the macroscopic inspection of the sample with the microscope 60 ; The input value of is displayed in area 110 . The control unit 51 receives the value of the formed component counted in the visual inspection of the sample through the input unit 54 while the interface 100 is displayed, and displays the received count value in the input value display area 110 .

Description

technical field [0001] The invention relates to a sample inspection system, an information processing device and an information processing method. Background technique [0002] Japanese Patent Laying-Open (Japanese Laid-Open) No. 7-49346 describes a urine sediment inspection device that automatically classifies formed components such as red blood cells and white blood cells in urine and a urine sediment inspection device that detects chemical components such as sugar and protein in urine. Qualitative inspection device. The urine sediment test result and the urine qualitative test result are displayed on the display device together. [0003] The types and states of the formed components contained in urine samples are various, and there are also samples in which the formed components cannot be correctly classified, or samples in which the status of the urine sample cannot be judged solely by the classification result of the urine sediment inspection device. For this kind of ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N33/493
CPCG01N33/493G01N35/10G01N15/1468G01N15/1456G01N15/04G01N35/00603G01N2015/1006G02B21/0004G02B21/365G02B21/368
Inventor 今井洋一木西基高野裕士小山一明
Owner SYSMEX CORP
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