Adaptation method and device for flat panel detector and grid, and medical imaging system

A flat panel detector and grid technology, applied in the field of image processing

Active Publication Date: 2021-10-22
SIEMENS SHANGHAI MEDICAL EQUIP LTD
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  • Application Information

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Problems solved by technology

[0003] The combination of grid and flat panel detector plays an important role in the effect of artifact removal. In many X-ray products, a medical imaging system can use two or more different types of flat panel detectors (flat planedetector sharing ), the existing solutions cannot achieve good artifact removal effects for different combinations of flat panel detectors and grids

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  • Adaptation method and device for flat panel detector and grid, and medical imaging system
  • Adaptation method and device for flat panel detector and grid, and medical imaging system
  • Adaptation method and device for flat panel detector and grid, and medical imaging system

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Embodiment Construction

[0044] In order to have a clearer understanding of the technical features, purposes and effects of the present invention, the specific implementation manners of the present invention will now be described with reference to the accompanying drawings, in which the same symbols represent the same parts.

[0045] In this article, "schematic" means "serving as an example, example or illustration", and any illustration or implementation described as "schematic" should not be interpreted as a more preferred or more advantageous Technical solutions.

[0046] In order to make the drawing concise, each drawing only schematically shows the parts related to the present invention, and they do not represent the actual structure of the product. In addition, to make the drawings concise and easy to understand, in some drawings, only one of the components having the same structure or function is schematically shown, or only one of them is marked.

[0047]In this article, "one" and "one" not o...

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Abstract

The invention provides a matching method and equipment of a flat panel detector and a grid, and a medical imaging system. The method is used for a combination of a flat panel detector and a grid, comprising: collecting the exposed first image; acquiring basic information of the flat panel detector; acquiring the theoretical frequency of the grid line of the grid; according to the basic information of the flat panel detector Determine the actual sampling frequency of the flat panel detector, calculate the estimated frequency of the grid line artifact in the first image caused by the grid line according to the grid line theoretical frequency and the actual sampling frequency of the flat panel detector; The estimated frequency is used as the center to set the maximum allowable deviation interval; and the actual frequency of the grid line artifact is found within the maximum allowable deviation range, and the grid line artifact in the first image is removed to obtain the second image. The invention can achieve the ideal grid line artifact removal effect for different combinations of flat panel detectors and grid lines.

Description

technical field [0001] The invention relates to the field of image processing, in particular to a matching method and equipment for a flat panel detector and a grid, and also relates to a medical imaging system. Background technique [0002] As a key component of the X-ray imaging diagnostic system, the grid plays a decisive role in removing scattered rays and increasing image contrast. Commonly used in the system are high-frequency static grids (high-frequency static grids) and low-frequency dynamic grids (low-frequency dynamic grids). Due to the high price and large attenuation of high-frequency static grids, low-frequency dynamic grids will increase the complexity of the system At present, more and more products apply low-frequency static grids to the system, and use image post-processing algorithms to remove the artifacts generated by the grids. [0003] The combination of grid and flat panel detector plays an important role in the effect of artifact removal. In many X-...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): A61B6/00A61B6/06
CPCA61B6/06A61B6/5205A61B6/5258
Inventor 李莉
Owner SIEMENS SHANGHAI MEDICAL EQUIP LTD
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