PCIe solid state drive production line test system

Abstract

A PCIe type solid state hard disk production line teste system is disclosed, including a master control module, an input control module, an output control module, and a power management module. The invention utilizes the structure design flexibility of the PCIe bus transmission mode, small footprint, at the same time, it can ensure the integrity of high-speed PCIe signal, compact system, during the testing process, the data and signals are transmitted bidirectionally, and all the data and signals are sent out by the testing host computer, which are transmitted to the main control module through the special channel through the input control module, and then transmitted to the lower computer through the output control module, and then returned to the testing host computer through the original path, so that the production efficiency and the space cost can be greatly improved.

Description

technical field [0001] The invention relates to the field of data storage, in particular to a test system for a PCIe solid-state hard drive production line. Background technique [0002] Solid State Drives (Solid State Drives), referred to as solid disks, Solid State Drives (Solid State Drives) are hard disks made of solid-state electronic memory chip arrays, consisting of a control unit and a storage unit (FLASH chip, DRAM chip). The specifications and definitions of interfaces, functions and usage methods of solid-state hard disks are exactly the same as those of ordinary hard disks, and the shape and size of the products are also completely consistent with ordinary hard disks. It is widely used in military, vehicle, industrial control, video surveillance, network monitoring, network terminals, electric power, medical, aviation, navigation equipment and other fields. With the upgrading of storage products, solid-state drives are increasingly favored by all walks of life d...

AI Technical Summary

Problems solved by technology

[0003] For the QA test of the production line, there is currently no complete solution, only some single, simple, rough power-on and power-on and simulation experiments