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An Improved Gibbs Sampling Beidou Satellite Selection Method

A Gibbs sampling and Beidou satellite technology, applied in the field of Beidou satellite navigation and positioning, can solve the problems of large amount of calculation, difficult to apply high dynamic observation, poor real-time performance, etc.

Active Publication Date: 2020-06-12
NO 54 INST OF CHINA ELECTRONICS SCI & TECH GRP
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AI Technical Summary

Problems solved by technology

The traditional traversal star selection algorithm traverses all Beidou satellite combinations and selects the n Beidou satellites with the smallest GDOP value as the best combination. This algorithm has the highest positioning accuracy, but it has a large amount of calculation and poor real-time performance, so it is difficult to apply to high dynamic to observe

Method used

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  • An Improved Gibbs Sampling Beidou Satellite Selection Method
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  • An Improved Gibbs Sampling Beidou Satellite Selection Method

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Embodiment Construction

[0055] In this embodiment, an improved Gibbs sampling Beidou satellite selection method uses Gibbs sampling to construct an energy function according to the optimization goal to calculate the probability of selecting Beidou satellites in each dimension, and completes the combination of Beidou satellites Optimize selection. This method is applied to various applications of Beidou satellite navigation, and selects suitable n Beidou satellites from multiple visible Beidou satellites for navigation calculation; The Beidou satellites of the signal usually have about 15 visible Beidou satellites at a certain moment; the suitable n Beidou satellites refer to the combination of Beidou satellites with the minimum GDOP value, which can ensure the positioning accuracy; specifically, Such as figure 1 As shown, the method is carried out as follows:

[0056] Step 1, calculating the azimuth and elevation angle of the visible satellite;

[0057] Step 1.1, taking the observation point as th...

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Abstract

The invention discloses an improved-Gibbs-sampling-based Beidou satellite selection method comprising the following steps: calculating an azimuth and an elevation angle of a Beidou visible satellite at a monitoring point to obtain state matrixes of n Beidou satellite, and using a GDOP value as an objective function of Beidou satellite selection; and on the basis of an optimized Gibbs sampling algorithm, searching for a Beidou satellite combination enabling the objective function value to be optimized to obtain an optimal solution. On the basis of the adaptive sweeping type improvement strategy, a phenomenon of falling into the local optimization of the algorithm is avoided and convergence to the optimal Beidou satellite selection scheme is realized well. According to the invention, the optimized Gibbs sampling algorithm is applied to the Beidou satellite selection process and the inherent advantages, including low complexity, fast convergence speed and good performance of the Gibbs sampling algorithm are utilized fully, so that the quality and efficiency of the Beidou satellite selection are improved effectively. The improved-Gibbs-sampling-based Beidou satellite selection method has the broad application prospects.

Description

technical field [0001] The invention belongs to the field of Beidou satellite navigation and positioning, in particular to an improved Gibbs sampling Beidou satellite selection method. Background technique [0002] In various applications of Beidou satellite navigation and positioning, in order to ensure the positioning accuracy, it is necessary to select suitable n (n≥4) Beidou satellites from multiple observable Beidou satellites for calculation. It is found from the research that when the observation error is constant, the difference in the geometric relationship between the observation location and the n Beidou satellites participating in the positioning will directly affect the positioning error. The final solution result of the navigation Beidou satellite positioning equation can be expressed as: [0003] ΔX=GDOP·Δρ (1) [0004] In formula (1), ΔX is the position error, Δρ is the observation error, and GDOP (geometrical dilution of precision) is the geometrical preci...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01S19/28
CPCG01S19/28
Inventor 夏娜洪韵晴智奇楠徐思常亮
Owner NO 54 INST OF CHINA ELECTRONICS SCI & TECH GRP
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