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Terahertz image nondestructive testing method, device and equipment

A terahertz and image technology, applied in the field of image processing, can solve the problem that the damage characteristics of terahertz images cannot be accurately represented

Active Publication Date: 2019-06-18
GUANGDONG UNIV OF TECH
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  • Claims
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Problems solved by technology

[0004] The purpose of the present invention is to provide a method, device, equipment and computer-readable storage medium for non-destructive testing of terahertz images, so as to solve the problem that the non-destructive testing methods provided by the prior art cannot accurately represent the damage characteristics of terahertz images

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  • Terahertz image nondestructive testing method, device and equipment

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Embodiment Construction

[0046] The core of the present invention is to provide a method, device, equipment and computer-readable storage medium for non-destructive testing of terahertz images, which can accurately locate the boundaries of defects in terahertz images by using multiple attention mechanisms, and improve the performance of non-destructive testing of terahertz images. efficiency and accuracy.

[0047] In order to enable those skilled in the art to better understand the solution of the present invention, the present invention will be further described in detail below in conjunction with the accompanying drawings and specific embodiments. Apparently, the described embodiments are only some of the embodiments of the present invention, but not all of them. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0048] Please refer to fi...

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Abstract

The invention discloses a terahertz image nondestructive detection method, device and equipment and a computer readable storage medium, and the method comprises the steps: inputting a to-be-detected terahertz image into a deep convolutional neural network, and extracting a feature map; converting the feature map into an attention map by using the attention mechanism, the data attribute of the terahertz image, a first target relation matrix and a first target coding matrix; converting the attention graph into a target image feature by using an attention mechanism, the data attribute, a second target relation matrix and a second target coding matrix; converting the target image features into a standard common feature; and determining a damage classification result of the terahertz image by utilizing the standard common feature, the target classification weight matrix and the Softmax function, thereby determining the damage type and damage degree of the terahertz image. According to the method, the device, the equipment and the computer readable storage medium provided by the invention, the damage characteristics of the terahertz image are accurately represented by utilizing multipleattention mechanisms.

Description

technical field [0001] The present invention relates to the technical field of image processing, in particular to a method, device, equipment and computer-readable storage medium for non-destructive testing of terahertz images. Background technique [0002] In recent years, scholars at home and abroad have used terahertz imaging technology to conduct related research on non-destructive flaw detection of materials, especially in the later image enhancement of flaw detection imaging. At present, the technical methods of non-destructive testing of terahertz images mainly include: non-destructive testing of terahertz images based on wavelet transform and Lipsitz exponent and non-destructive testing methods based on wavelet denoising. The non-destructive detection of terahertz images based on wavelet transform and Lipsyntz index loses damage attribute information, and the representation of damage features is very vague, and the final classification results need to be realized man...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06T7/00G06N3/04
Inventor 吴壮辉黄国恒程良伦
Owner GUANGDONG UNIV OF TECH
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