Multimeter and resistance and capacitance measuring method

A multimeter and capacitance measurement technology, applied in the field of measurement, can solve the problems of low measurement efficiency, multimeter measuring resistance and capacitance cannot be measured in the same circuit, and high production cost

Inactive Publication Date: 2019-11-15
QINGDAO HANTEK ELECTRONICS
View PDF3 Cites 1 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] The current multimeters cannot measure resistance and capacitance through the same circuit, resulti

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Multimeter and resistance and capacitance measuring method
  • Multimeter and resistance and capacitance measuring method
  • Multimeter and resistance and capacitance measuring method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0062] The technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some optional embodiments of the present invention, not all embodiments , can be used with reference or without reference, but not to limit the scope of the present invention and its application, wherein, the terms "first" and "second" are only used for descriptive purposes, and cannot be understood as indicating or implying relative importance or implicit Contains the number of indicated technical features. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of these features. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present inven...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention provides a multimeter and a resistance and capacitance measuring method. The multimeter comprises a reference source, an analog switch, a buffer and a one-way module and also comprises an FPGA (field programmable gate array), a controllable current source, a protection module, a gear selection circuit, a resistance measurement circuit, a capacitance measurement circuit and a threshold comparator, wherein the protection module comprises an a-way protection circuit and a b-way protection circuit, the controllable current source receives reference signals sent by the reference source and selects actual measurement object gear according to the gear selection circuit, the FPGA controls to produce corresponding current, the current is outwards output through the a-way protection module, and resistance and capacitance are measured by use of the same circuit.

Description

technical field [0001] The invention relates to the field of measurement technology, in particular to a multimeter and a method for measuring resistance and capacitance. Background technique [0002] The multimeter can be used to measure current, voltage, resistance, etc., and the invention patent with the application number 201810402050.0 discloses a multimeter. parameter, which effectively avoids the problem that the multimeter setting plug hole is easy to get dust and affects the test stability; the invention patent with the application number 201810221870. In order to realize that when the range of the multimeter is exceeded, it will be reminded by the alarm flashing light to eliminate potential safety hazards; the invention patent with the application number 201711191271. Chip, improve test speed; [0003] The current multimeters cannot measure resistance and capacitance through the same circuit, resulting in high production costs and low measurement efficiency. It is...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
IPC IPC(8): G01R15/12G01R27/02G01R27/26
CPCG01R15/125G01R27/02G01R27/2605
Inventor 郝春华
Owner QINGDAO HANTEK ELECTRONICS
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap