Simulation test bench for millimeter wave radar intelligence performance evaluation

A millimeter wave radar and simulation test technology, applied in radio wave measurement systems, instruments, etc., can solve problems such as difficult dynamic test sensor device trial scenarios, inability to provide a credible basis for system selection, and increased time and labor costs.

Pending Publication Date: 2020-06-23
中汽数据(天津)有限公司
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The commonly used test platforms in the industry are generally static platforms or actual vehicles equipped with specific devices, but the former is difficult to dynamically test the trial scenarios of each sensor device; while the latter requires repeated disassembly and assembly of different devices under test when testing different components, and Repeated calibration and initialization settings not only increase time and labor costs, but also bring errors, which cannot provide a credible basis for system selection

Method used

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  • Simulation test bench for millimeter wave radar intelligence performance evaluation
  • Simulation test bench for millimeter wave radar intelligence performance evaluation
  • Simulation test bench for millimeter wave radar intelligence performance evaluation

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Embodiment Construction

[0021] In order to further understand the structure, features and other purposes of the present invention, the attached preferred embodiments are now described in detail with accompanying drawings as follows. The embodiments described in the accompanying drawings are only used to illustrate the technical solutions of the present invention and are not limiting this invention.

[0022] A simulation test bench for millimeter-wave radar intelligence performance evaluation, combined with figure 1 , image 3 , including a base 1, a bracket 2, a frame plate 3, a motor 4, a turntable 5 and a traction component 6, the bracket 2 is slidably connected to one side of the base 1, the bracket 2 is loaded with a millimeter-wave radar, and the turntable 5 is rotatably connected to the other side of the base 1 side, the frame plate 3 is fixed on the turntable 5, the test mold 7 is erected on the frame plate 3, the motor 4 is fixed on the base 1 on one side of the turntable 5, the motor 4 driv...

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Abstract

The invention provides a simulation test bench for millimeter wave radar intelligence performance evaluation. The test bench comprises a base, a support, a frame plate, a motor, a turntable and a traction component. The support is slidably connected to one side of the base. A millimeter wave radar is loaded on the support; the turntable is rotatably connected to the other side of the base; the frame plate is fixedly connected to the turntable; and a test mold is erected on the frame plate, the motor is fixedly connected to the base on one side of the turntable, the motor drives the turntable to rotate, the traction component is erected in the base below the support, and the traction component drives the support to slide in a direction close to or away from the frame plate. The simulation test bench is capable of accurately testing precision of the vehicle-mounted millimeter radar.

Description

technical field [0001] The invention relates to the technical field of automobile testing, in particular to a simulation test bench for evaluating the intelligence performance of millimeter-wave radar. Background technique [0002] With the development of ADAS (Advanced Driver Assistance System) and unmanned driving technology, its electronic control system is becoming more and more diversified, and the types of control units and sensors are becoming more and more abundant. When selecting control units and sensors, build a test platform It is particularly important to conduct professional tests on various devices. The commonly used test platforms in the industry are generally static platforms or actual vehicles equipped with specific devices, but the former is difficult to dynamically test the trial scenarios of each sensor device; while the latter requires repeated disassembly and assembly of different devices under test when testing different components, and Repeated cali...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01S7/40
CPCG01S7/4052
Inventor 张鲁杜志彬赵帅朱向雷翟洋沈永旺陈硕
Owner 中汽数据(天津)有限公司
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