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Method and device for testing super-capacity volume of storage system, and storage medium

A storage system and testing method technology, applied in the directions of faulty hardware testing method, error detection/correction, detection of faulty computer hardware, etc. problems, to achieve the effect of shortening test execution time, simple structure, and reliable design principle

Active Publication Date: 2020-07-31
INSPUR SUZHOU INTELLIGENT TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] However, during the test, it was found that there are some problems with the large-capacity volume. One is that the volume is too large, and it takes a very long time to format it. Data consistency verification may take several days
Because the actions of writing and reading are serial, it may take a week to complete a round of testing. In this case, the testing efficiency is very low. How to improve the testing efficiency of large-capacity volumes and shorten the testing is actually an urgent need to solve

Method used

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  • Method and device for testing super-capacity volume of storage system, and storage medium
  • Method and device for testing super-capacity volume of storage system, and storage medium

Examples

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Embodiment 1

[0038] Such as figure 1 As shown, the technical solution of the present invention provides a method for testing an ultra-large capacity volume of a storage system, comprising the following steps:

[0039] S1: Query the sector information of the large-capacity volume through the storage command, and sort the sector block addresses of the large-capacity volume in the memory to generate an address string;

[0040] S2: Map the large-capacity volume to the host, and trigger the write operation to the volume on the host side;

[0041] S3: Detect the offset between the write pointer and the read pointer, and when the offset between the write pointer and the read pointer is equal to the preset offset, the read pointer starts a read operation;

[0042] S4: Compare the content written in each sector block with the preset write source code. If the comparison is consistent, the read pointer points to the next block address and continue to read and compare. If they are inconsistent, stop ...

Embodiment 2

[0044] Such as figure 2 As shown, the technical solution of the present invention provides a method for testing an ultra-large capacity volume of a storage system, comprising the following steps:

[0045] S1: Query the sector information of the large-capacity volume through the storage command, sort the sector block addresses of the large-capacity volume in memory to generate an address string; for example, generate an address string of 0x000001-0xFFFFFF;

[0046] S2: Map the large-capacity volume to the host, and trigger the write operation to the volume on the host side;

[0047] It should be noted that before performing this step, one or more addresses need to be selected from the address string as 0x000001 as the initial address of the LBA and put into the memory; preset write source code; define write pointer and read pointer; define between write and read pointers The offset between; assuming a single process reads and writes, select an initial address, and initialize ...

Embodiment 3

[0057] The technical solution of the present invention provides an electronic device, which may include: a processor, a communication interface, a memory, and a bus, wherein the processor, the communication interface, and the memory complete the mutual communication through the bus. Communication. The bus can be used for information transfer between electronic devices and sensors. The processor can call the logical instructions in the memory to perform the following method: query the sector information of the large-capacity volume through the storage command, sort the sector block addresses of the large-capacity volume in the memory to generate an address string; map the large-capacity volume to The host triggers the write operation to the volume on the host side; detects the offset between the write pointer and the read pointer, and when the offset between the write pointer and the read pointer is equal to the preset offset, the read pointer starts the read operation; Every ...

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Abstract

The invention provides a method and a device for testing super-capacity volume of a storage system, and a storage medium, and the method comprises the following steps: querying sector information of alarge-capacity volume through a storage command, and sorting sector block addresses of the large-capacity volume in a memory to generate an address string; mapping the high-capacity volume to a host,and triggering a write operation on the volume at a host end; detecting the offset between the writing pointer and the reading pointer, and when the offset between the writing pointer and the readingpointer is equal to the preset offset, starting the reading operation by the reading pointer; comparing the written content of each sector block with the preset writing source code once, if the written content of each sector block is consistent with the preset writing source code, enabling the reading pointer to point to the next address, continuing to read and compare, and if the written contentof each sector block is inconsistent with the preset writing source code, stopping writing and reading operation and returning sector block addresses with inconsistent content, and ending the test.

Description

technical field [0001] The invention relates to the technical field of storage system testing, in particular to a testing method, equipment and storage medium for super-large capacity volumes of a storage system. Background technique [0002] With the advancement and development of technology, the capacity of storage media has been greatly improved from the initial tens of KB to the current hard disk capacity of a single block of more than ten TB. With the emergence of storage systems that support dozens of PBs or even hundreds of PBs, the use of ultra-large volumes has also increased. [0003] However, during the test, it was found that there are also some problems with large-capacity volumes. First, the capacity is too large, and formatting takes a very long time. Usually, data consistency verification for volumes exceeding 100 TB may take several days. Because the actions of writing and reading are serial, it may take a week to complete a round of testing. In this case, ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/22
CPCG06F11/2205G06F11/2273
Inventor 许春赵伟齐武波
Owner INSPUR SUZHOU INTELLIGENT TECH CO LTD
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