Weak supervision machine vision detection method and system based on artificial defect simulation
A technology of machine vision detection and artificial defects, applied in the field of visual inspection, can solve problems such as difficulty in collecting defect pictures and small number of samples, and achieve the effect of saving time and labor, solving small number of samples, and simple and efficient creation process
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment
[0080] This embodiment provides a weakly supervised machine vision detection method based on artificial defect simulation, including the following steps:
[0081] S1: For the four types of defects: scratches, hairs, light-colored dirt, and dark-colored dirt, set structural parameters to control the shape, size, thickness, brightness, and internal texture of the defects, and generate a large number of defect materials through simulation. Create a simulation defect database;
[0082] The detailed process of the simulation method for scratches, hairs, light-colored dirt, and dark-colored dirt defects is as follows:
[0083] Linear defects are mainly manifested as scratches and fluff defects. The appearance of scratches is mainly linear, while the shape of fluff is curved. According to the actual detection experience, the linear picture material collected by the image sensor presents a variety of different forms of expression, such as various differences in length, direction, cur...
PUM
Login to View More Abstract
Description
Claims
Application Information
Login to View More 


