MEMS capacitive sensor and preparation method thereof
A technology of capacitive and pressure sensors, which is applied in fluid pressure measurement using capacitance changes, piezoelectric/electrostrictive/magnetostrictive devices, televisions, etc., can solve complex manufacturing processes, poor reliability, MEMS capacitive pressure sensors Poor linearity and other problems, to achieve the effect of low cost, high consistency, high linearity
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Embodiment 1
[0037] Such as figure 1 As shown, the MEMS capacitive pressure sensor proposed by the present invention includes a stacked first substrate 4 and a second substrate 7;
[0038] A pressure-sensitive film 1 is formed on the upper surface of the first substrate 4; a first groove 3 is formed on the lower surface of the first substrate 4 opposite to the pressure-sensitive film 1 by etching;
[0039] A dielectric block 2 is arranged on the lower surface of the pressure sensitive film 1, and the dielectric block 2 is located in the first groove 3;
[0040] The second groove 8 is arranged on the upper surface of the second substrate 7, and forms a vacuum chamber 12 with the first groove 3;
[0041] The third groove 9 and the fourth groove 10 are arranged on the lower surface of the second substrate 7 surrounding and spaced apart from the second groove 8;
[0042] an insulating layer 11 covering the lower surface of the second substrate 7;
[0043] The first electrode 5 is disposed o...
Embodiment 2
[0060] The present invention also proposes a preparation method of a MEMS capacitive pressure sensor, specifically, the preparation method comprises the following steps:
[0061] a. Select an N-type (100) single crystal silicon wafer with a thickness of 500mm as the first substrate 4, and obtain a first groove 3 with a depth of, for example, 480 μm and a thickness of 20 μm by photolithography and KOH anisotropic wet etching The pressure sensitive membrane 1;
[0062] b. Install a dielectric block 2 on the lower surface of the pressure sensitive membrane 1 by assembling, the dielectric block 2 is, for example, a barium titanate ceramic block, and its size is, for example: length´width´height=200μm´200μm´600μm;
[0063] c. Select a 500mm thick N-type (100) single crystal silicon wafer as the second substrate 7, and carry out photolithography and KOH anisotropic wet etching on the upper surface of the second substrate 7 to obtain a depth of, for example, 400 μm, a second groove ...
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